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Impact of energy straggle on proton-induced single event upset test in a 65-nm SRAM cell 期刊论文
CHINESE PHYSICS B, 2017, 卷号: 26, 页码: 6
作者:  Ye, Bing;  Liu, Jie;  Wang, Tie-Shan;  Liu, Tian-Qi;  Luo, Jie
收藏  |  浏览/下载:18/0  |  提交时间:2018/05/31
Prediction of proton-induced SEE error rates for the VATA160 ASIC 期刊论文
NUCLEAR SCIENCE AND TECHNIQUES, 2017, 卷号: 28, 页码: 6
作者:  Xi, Kai;  Jiang, Di;  Gao, Shan-Shan;  Kong, Jie;  Zhao, Hong-Yun
收藏  |  浏览/下载:15/0  |  提交时间:2018/05/31


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