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INSITU ELECTRON-SPIN RESONANCE MEASUREMENTS OF THERMALLY INDUCED METASTABLE DEFECTS IN DOPED HYDROGENATED AMORPHOUS-SILICON CARBON-FILMS 会议论文
13TH INTERNATIONAL CONF ON AMORPHOUS AND LIQUID SEMICONDUCTORS, ASHEVILLE, NC, AUG 21-25, 1989
作者:  HE, DY;  ZHANG, FQ;  CHEN, W;  CHEN, GH
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