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CORC

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Influence of doubly-hydrogenated oxygen vacancy on the TID effect of MOS devices 期刊论文
FRONTIERS IN MATERIALS, 2022, 卷号: 9
作者:  Lu, Guangbao;  Liu, Jun;  Zheng, Qirong;  Li, Yonggang
收藏  |  浏览/下载：15/0  |  提交时间：2022/12/23
Electrical tailoring of the photoluminescence of silicon-vacancy centers in diamond/silicon heterojunctions 期刊论文
JOURNAL OF MATERIALS CHEMISTRY C, 2022, 页码: 10
作者:  Guo, Xiaokun;  Yang, Bing;  Lu, Jiaqi;  Li, Haining;  Huang, Nan
收藏  |  浏览/下载：27/0  |  提交时间：2022/07/14
Effect of surface oxidation on photoluminescence of silicon vacancy color centers in the nanocrystalline diamond films 期刊论文
APPLIED SURFACE SCIENCE, 2021, 卷号: 552, 页码: 9
作者:  Yu, Biao;  Yang, Bing;  Li, Haining;  Lu, Jiaqi;  Huang, Nan
收藏  |  浏览/下载：23/0  |  提交时间：2021/10/15
Bright silicon vacancy centers in diamond/SiC composite films synthesized by a MPCVD method 期刊论文
CARBON, 2021, 卷号: 171, 页码: 455-463
作者:  Yang, Bing;  Li, Haining;  Yu, Biao;  Lu, Jiaqi;  Huang, Nan
收藏  |  浏览/下载：23/0  |  提交时间：2021/03/15
Interaction of irradiation-induced point defects with transmutants (H, He, Li, Be, B, Mg, Al and P) in 3C-SiC ceramics 期刊论文
JOURNAL OF THE EUROPEAN CERAMIC SOCIETY, 2020, 卷号: 40
作者:  Sun, Jingjing;  You, Yu-Wei;  Xu, Yichun;  Wu, Xuebang;  Li, B. S.
收藏  |  浏览/下载：22/0  |  提交时间：2020/10/26
The effect of finish layer on the interfacial cracking failure of Au-Si bonding 期刊论文
ENGINEERING FAILURE ANALYSIS, 2020, 卷号: 115, 页码: 8
作者:  Gao, Li-Yin;  Wen, Jian;  Li, Cai-Fu;  Chen, Chunhuan;  Liu, Zhi-Quan
收藏  |  浏览/下载：15/0  |  提交时间：2021/02/02
锰基复合氧化物制备及其催化氧化VOCs性能研究 学位论文
: 中国科学院大学, 2020
作者:  张敏
收藏  |  浏览/下载：7/0  |  提交时间：2021/09/07
Angular distribution of L characteristic X-ray emission from Au target impacted by photons 期刊论文
ACTA PHYSICA SINICA, 2020, 卷号: 69, 期号: 12, 页码: 6
作者:  Liu Yu;  Xu Zhong-Feng;  Wang Xing;  Hu Peng-Fei;  Zhang Xiao-An
收藏  |  浏览/下载：5/0  |  提交时间：2021/12/15
Enhanced and switchable silicon-vacancy photoluminescence in air-annealed nanocrystalline diamond films 期刊论文
CARBON, 2020, 卷号: 156, 页码: 242-252
作者:  Yang, Bing;  Yu, Biao;  Li, Haining;  Huang, Nan;  Liu, Lusheng
收藏  |  浏览/下载：15/0  |  提交时间：2021/02/02
Charge trapping effect in HfO2-based high-k gate dielectric stacks after heavy ion irradiation: The role of oxygen vacancy 期刊论文
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 2019, 卷号: 459, 页码: 143-147
作者:  Li, Zongzhen;  Liu, Tianqi;  Bi, Jinshun;  Yao, Huijun;  Zhang, Zhenxing
收藏  |  浏览/下载：32/0  |  提交时间：2022/01/19

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