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Evolution of microstructure and related properties of PbZr0.4Ti0.6O3 films on F-doped tin oxide with annealing temperature 期刊论文
JOURNAL OF APPLIED PHYSICS, 2010, 卷号: 107
作者:  T. Zhang, G. J. Hu, H. J. Bu, J. Wu, J. H. Chu, N. Dai
收藏  |  浏览/下载:9/0  |  提交时间:2011/09/13
Microstructure Evolution with Thickness and Hydrogen Dilution Profile in Microcrystalline Silicon Solar Cells 会议论文
Symposium on Amorphous and Nanocrystalline Silicon Science and Technology held at the 2004 MRS Spring Meeting
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收藏  |  浏览/下载:9/0  |  提交时间:2016/11/05


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