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浏览/检索结果: 共19条，第1-10条 帮助 限定条件 专题：北京大学    第一署名单位    第一作者单位    通讯作者单位     已选(0)清除 条数/页：5101520253035404550556065707580859095100   排序方式：请选择作者升序作者降序题名升序题名降序发表日期升序发表日期降序提交时间升序提交时间降序 笔谈“抗日战争与中日关系史研究” 期刊论文 抗日战争研究, 2009 步平; 荣维木; 徐勇; 江沛; 高晓燕; 李淑娟; 王希亮; 张连红; 张生; 刘萍; 徐志民; 张朔人; 陶水木; 潘国旗 收藏  |  浏览/下载：1/0  |  提交时间：2015/11/12 中日关系史  南京大屠杀  留日学生  日本帝国主义  浙东抗日根据地  侵华日军  中国抗日战争史  东北沦陷  日本军队  近代史研究所   The Genomes of Oryza sativa: A history of duplications 期刊论文 公共科学图书馆生物学, 2005 Yu, J; Wang, J; Lin, W; Li, SG; Li, H; Zhou, J; Ni, PX; Dong, W; Hu, SN; Zeng, CQ; Zhang, JG; Zhang, Y; Li, RQ; Xu, ZY; Li, ST; Li, XR; Zheng, HK; Cong, LJ; Lin, L; Yin, JN; Geng, JN; Li, GY; Shi, JP; Liu, J; Lv, H; Li, J; Wang, J; Deng, YJ; Ran, LH; Shi, XL; Wang, XY; Wu, QF; Li, CF; Ren, XY; Wang, JQ; Wang, XL; Li, DW; Liu, DY; Zhang, XW; Ji, ZD; Zhao, WM; Sun, YQ; Zhang, ZP; Bao, JY; Han, YJ; Dong, LL; Ji, J; Chen, P; Wu, SM; Liu, JS; Xiao, Y; Bu, DB; Tan, JL; Yang, L; Ye, C; Zhang, JF; Xu, JY; Zhou, Y; Yu, YP; Zhang, B; Zhuang, SL; Wei, HB; Liu, B; Lei, M; Yu, H; Li, 收藏  |  浏览/下载：3/0  |  提交时间：2015/11/16 RICE GENOME  ARABIDOPSIS-THALIANA  SEQUENCE-ANALYSIS  PROTEIN NETWORKS  DRAFT SEQUENCE  PLANT GENOMES  GENES  EVOLUTION  DNA  ANNOTATION   Improved electrical and reliability characteristics of HfN-HfO2-gated nMOSFET with 0.95-nm EOT fabricated using a gate-first process 期刊论文 ieee electron device letters, 2005 Kang, JF; Yu, HY; Ren, C; Wang, XP; Li, MF; Chan, DSH; Yeo, YC; Sa, N; Yang, H; Liu, XY; Han, RQ; Kwong, DL 收藏  |  浏览/下载：2/0  |  提交时间：2015/11/10 HfO2 gate dielectric  instability of V-th  mobility  nMOS transistor  sub-1-nm equivalent oxide thickness (EOT)  ELECTRODE   Mechanism of positive-bias temperature instability in sub-1-nm TaN/HfN/HfO2 gate stack with low preexisting traps 期刊论文 ieee electron device letters, 2005 Sa, N; Kang, JE; Yang, H; Liu, XY; He, YD; Han, RQ; Ren, C; Yu, HY; Chan, DSH; Kwong, DL 收藏  |  浏览/下载：5/0  |  提交时间：2015/11/10 electric stress-induced defect generation (ESIDG)  high-kappa gate dielectric  positive-bias temperature instability (PBTI)  reaction-diffusion (R-D) model  DIELECTRIC STACKS  GENERATION  STRESS   Scalability and reliability of TaN/HfN/HfO(2) gate stacks fabricated by a high temperature process 其他 2005-01-01 Kang, JF; Yu, HY; Ren, C; Yang, H; Sa, N; Liu, XY; Han, RQ; Li, MF; Chan, DSH; Kwong, DL 收藏  |  浏览/下载：2/0  |  提交时间：2015/11/13 Ultrathin HfO2(EOT < 0.75nm) gate stack with TaN/HfN electrodes fabricated using a high-temperature process 期刊论文 ieee ecs电化学与固体快报, 2005 Kang, JF; Yu, HY; Ren, C; Li, MF; Chan, DSH; Liu, XY; Kwong, DL 收藏  |  浏览/下载：1/0  |  提交时间：2015/11/13 An improved pregate cleaning process for high-k gate dielectric fabrication 期刊论文 ieee ecs电化学与固体快报, 2005 Kang, JF; Yu, HY; Ren, C; Liu, XY; Han, RQ; Yu, B; Kwong, DL 收藏  |  浏览/下载：1/0  |  提交时间：2015/11/13 MOBILITY DEGRADATION  STABILITY  ELECTRODE  SURFACES  SI(100)  DEVICES   BGI-RIS: an integrated information resource and comparative analysis workbench for rice genomics 期刊论文 核酸研究, 2004 Zhao, WM; Wang, J; He, XM; Huang, XB; Jiao, YZ; Dai, MT; Wei, SL; Fu, J; Chen, Y; Ren, XY; Zhang, Y; Ni, PX; Zhang, JG; Lil, SG; Wang, J; Wong, GKS; Zhao, HY; Yu, J; Yang, HM; Wang, J 收藏  |  浏览/下载：4/0  |  提交时间：2015/11/16 DRAFT SEQUENCE  PLANT GENOMICS  DNA  PREDICTION  JAPONICA  DATABASE  GRASSES  GENES   Quantitative relationship between production and removal of OH and HO2 radicals in urban atmosphere 期刊论文 科学通报 英文版, 2004 Shao, M; Ren, XR; Wang, HX; Zeng, LM; Zhang, YH; Tang, XY 收藏  |  浏览/下载：5/0  |  提交时间：2015/11/13 atmospheric oxidizing capacity  radical  source  sink  MECHANISM   Charactcristics of sub-1 nm CVID HfO2 gate dielectrics with HfN electrodcs for advanccd CMOS applications 其他 2004-01-01 Kang, JF; Yu, HY; Ren, C; Wang, XP; Li, MF; Chan, DSH; Liu, XY; Han, RQ; Wang, YY; Kwong, DL 收藏  |  浏览/下载：2/0  |  提交时间：2015/11/13