QQ客服 官方微博 反馈留言

浏览/检索结果: 共5条，第1-5条 帮助 限定条件 专题：北京航空航天大学    第一署名单位    第一作者单位    通讯作者单位     已选(0)清除 条数/页：5101520253035404550556065707580859095100   排序方式：请选择作者升序作者降序题名升序题名降序发表日期升序发表日期降序提交时间升序提交时间降序 Development and validation of an MRI-based radiomic signature for the preoperative prediction of treatment response in patients with invasive functional pituitary adenoma 期刊论文 European journal of radiology, 2019, 页码: 108647 作者:  Fan Yanghua;  Liu Zhenyu;  Hou Bo;  Li Longfei;  Liu Xiaohai 收藏  |  浏览/下载：11/0  |  提交时间：2019/12/30 Invasive functional pituitary adenoma  Magnetic resonance imaging  Radiomics  Treatment response   Thermal environment prediction for metro stations based on an RVFL neural network 期刊论文 Algorithms, 2018, 卷号: 11 作者:  Tian, Q.;  Zhao, W.;  Wei, Y.;  Pang, L. 收藏  |  浏览/下载：5/0  |  提交时间：2019/12/30 Forecasting  Accurate prediction  Environmental quality  Functional link neural network  Metro stations  Prediction and analysis  RVFLNN  Temperature prediction  Thermal environment  Subway stations   Sensitive Bits Based Prediction Method of Functional Failure Time for SRAM-Based FPGA 会议论文 Prognostics and System Health Management Conference (PHM-Chengdu), Chengdu, PEOPLES R CHINA, 2016-10-19 作者:  Gao Cheng;  Wan Yongkang;  Zhang Cheng;  Wang Xiangfen;  Huang Jiaoying 收藏  |  浏览/下载：5/0  |  提交时间：2019/12/30 SRAM-based FPGA  sensitive bits  cellular automaton  fault injection experiment  function failure time   Residual lifetime prediction for lithium-ion battery based on functional principal component analysis and Bayesian approach 期刊论文 ENERGY, 2015, 卷号: 90, 页码: 1983-1993 作者:  Cheng, Yujie;  Lu, Chen;  Li, Tieying;  Tao, Laifa 收藏  |  浏览/下载：4/0  |  提交时间：2020/01/06 Lithium-ion battery  Lifetime prediction  Functional principal component analysis  Bayesian approach   A prediction technique for single-event effects on complex integrated circuits 期刊论文 Journal of Semiconductors, 2015, 卷号: 36 作者:  Zhao, Y.;  Yu, C.;  Fan, L.;  Yue, S.;  Chen, M. 收藏  |  浏览/下载：3/0  |  提交时间：2019/12/30 Integrated circuits  Nanotechnology  Reconfigurable hardware  Data patterns  Duty-cycle  Functional modules  Prediction techniques  Single event effects  Target circuits  Test Pattern  Universal method  Forecasting