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Characterization of carrier transport behavior of specific type dislocations in GaN by light assisted KPFM 期刊论文
Journal of Physics D-Applied Physics, 2020, 卷号: 53, 期号: 23, 页码: 6
作者:  C. H. Kai,X. J. Sun,Y. P. Jia,K. Jiang,Z. M. Shi,J. W. Ben,Y. Wu,Y. Wang and D. B. Li
收藏  |  浏览/下载:3/0  |  提交时间:2021/07/06
Spectral calibration of medical microscopic imaging spectrometer 期刊论文
Guangxue Jingmi Gongcheng/Optics and Precision Engineering, 2016, 卷号: 24, 期号: 5
作者:  Wei, W.;  J.-C. Cui;  Y.-G. Tang;  C. Sun and M.-Z. Pan
收藏  |  浏览/下载:13/0  |  提交时间:2017/09/11
TEM dislocations characterization of InxGa1-xAs/InP (100) (x=0.82) on mismatched InP substrate 期刊论文
Materials Letters, 2013, 期号: 106
Zhao L.; Sun J. G.; Guo Z. X.; Miao G. Q.
收藏  |  浏览/下载:19/0  |  提交时间:2014/05/14


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