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CORC

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Characterization of Arsenic Ultra-Shallow Junctions in Silicon Using Photocarrier Radiometry and Spectroscopic Ellipsometry 期刊论文
INTERNATIONAL JOURNAL OF THERMOPHYSICS, 2012, 卷号: 33, 期号: 10-11, 页码: 2082-2088
作者:  Huang, Qiuping;  Li, Bincheng;  Gao, Weidong
收藏  |  浏览/下载：14/0  |  提交时间：2015/07/10
Structural, Chemical, Optical, and Electrical Evolution of SnOx Films Deposited by Reactive rf Magnetron Sputtering 期刊论文
ACS Applied Materials &Interfaces, 2012, 卷号: 32, 期号: 4, 页码: 5673—5677
梁凌燕、曹鸿涛; Hao Luo, Ling Yan Liang,* Hong Tao Cao,* Zhi Min Liu, and Fei Zhuge
收藏  |  浏览/下载：9/0  |  提交时间：2013/12/16
The structural, optical and electrical properties of Y-doped SnO thin films and their p-type TFT application 期刊论文
JOURNAL OF PHYSICS D: APPLIED PHYSICS, 2012, 卷号: 111, 期号: 45, 页码: —
Cao HT(曹鸿涛); Ling Yan Liang, Zhi Min Liu, Hong Tao Cao, Wang Ying Xu, Xi Lian Sun, Hao Luo and Kai Cang
收藏  |  浏览/下载：10/0  |  提交时间：2013/12/16
Low-temperature (120 degrees C) growth of nanocrystalline silicon films prepared by plasma enhanced chemical vapor deposition from SiCl4/H-2 gases: Microstructure characterization 期刊论文
Applied Surface Science, 2012, 卷号: 258, 期号: 7, 页码: 3221-3226
L. Zhang; J. H. Gao; J. Q. Xiao; L. S. Wen; J. Gong; C. Sun
收藏  |  浏览/下载：13/0  |  提交时间：2013/02/05
Characterization of arsenic ultra-shallow junctions in silicon using photocarrier radiometry and spectroscopic ellipsometry 会议论文
International Journal of Thermophysics, 2012
作者:  Huang, Qiuping;  Li, Bincheng;  Gao, Weidong
收藏  |  浏览/下载：11/0  |  提交时间：2016/11/25
Effect of Gas Pressure on Optical Properties of Nanocrystalline Diamond Films Deposited on SiC Substrates 会议论文
International Conference on Energy, Environment and Sustainable Development (ICEESD 2011), 2011-10-21
作者:  Wu, Nan-Chun[1];  Xia, Yi-Ben[2];  Tan, Shou-Hong[3];  Wang, Lin-Jun[4]
收藏  |  浏览/下载：7/0  |  提交时间：2019/04/30
Optical parameters of Diamond Films Determined by Spectroscopic Ellipsometry Method 会议论文
RENEWABLE AND SUSTAINABLE ENERGY, PTS 1-7, 2011-10-21
作者:  Pan, Xiaoyu[1];  Wang, Linjun[2];  Huang, Jian[3];  Tang, Ke[4];  Bi, Mei[5]
收藏  |  浏览/下载：6/0  |  提交时间：2019/04/30
Monitoring the Layer-by-Layer Self-Assembly of Graphene and Graphene Oxide by Spectroscopic Ellipsometry 期刊论文
JOURNAL OF NANOSCIENCE AND NANOTECHNOLOGY, 2012, 卷号: 12, 期号: 1
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收藏  |  浏览/下载：4/0  |  提交时间：2014/12/05
Effects of temperature and sputtering power on the morphology and optical constants of thin tantalum films (Review) 期刊论文
Surface review and letters, 2012, 期号: 4, 页码: 1250039-1-1250039-6
作者:  Gao, S.;  Wang, S.;  Lian, J.;  Li, P.;  Wang, X.
收藏  |  浏览/下载：2/0  |  提交时间：2019/12/23
EFFECTS OF TEMPERATURE AND SPUTTERING POWER ON THE MORPHOLOGY AND OPTICAL CONSTANTS OF THIN TANTALUM FILMS 期刊论文
SURFACE REVIEW AND LETTERS, 2012, 卷号: 19, 期号: 4
作者:  Gao, Shang;  Wang, Shuyun;  Lian, Jie;  Li, Ping;  Wang, Xiao
收藏  |  浏览/下载：2/0  |  提交时间：2019/12/23

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