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CHARACTERIZATION OF EPITAXIAL COSI2 FILM GROWTH ON SI(100) BY SLOW POSITRON BEAM 期刊论文
SILICIDES, GERMANIDES, AND THEIR INTERFACES, 1994, 卷号: 320, 期号: 0, 页码: 233-238
LIU,P; LIN,CG; ZHOU,ZY; WENG,HM; LI,BZ; HAN,RD; Zou,SC
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