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REDUCTION OF SECONDARY DEFECTS IN BF, IMPLANTED SI(100) BY ION-BEAM DEFECT ENGINEERING 期刊论文
APPLIED PHYSICS LETTERS, 1994, 卷号: 64, 期号: 2, 页码: 175
ZHAO, QT; WANG, ZI; XU, TB; ZHU, PR; ZHOU, JS
收藏  |  浏览/下载:8/0  |  提交时间:2013/09/24
REDUCTION OF SECONDARY DEFECTS IN BF, IMPLANTED SI(100) BY ION-BEAM DEFECT ENGINEERING 期刊论文
应用物理学快报, 1994
ZHAO, QT; WANG, ZI; XU, TB; ZHU, PR; ZHOU, JS
收藏  |  浏览/下载:6/0  |  提交时间:2015/11/10


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