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Boron depth profiles in a-Si1-xCx:H(B) films after thermal annealing 会议论文
1991 International Conference on Thin Film Physics and Applications, Shanghai, China, April 15, 1991 - April 17, 1991
作者:  Liao, Changgeng;  Zheng, Zhihao;  Wang, Yongqiang;  Yang, Shengsheng
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