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Modified snapshot spectroscopic ellipsometry based on optical frequency-domain interferometry
期刊论文
Optik, 2021, 卷号: 228
作者:
Li, Siyuan
;
Zhang, Chunmin
;
Quan, Naicheng
收藏
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浏览/下载:29/0
  |  
提交时间:2021/01/21
Spectroscopic ellipsometry
Optical frequency-domain interferometry
Channel bandwidth
Study of the phase transition properties and electronic band structures of VO2 thin films grown on different substrates
期刊论文
MATERIALS RESEARCH EXPRESS, 2019, 卷号: 6
作者:
Guo, Yunfeng[1]
;
Zhang, Yuzhi[2]
;
Zhang, Liangmiao[3]
;
Lv, Xinrui[4]
;
Wu, Lingnan[5]
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  |  
浏览/下载:34/0
  |  
提交时间:2019/04/22
VO2
metal-to-insulator transition
spectroscopic ellipsometry
electronic structure
Study the optical properties of Pr2CuO4 thin films with different Tc0 via spectroscopic ellipsometry
期刊论文
MATERIALS RESEARCH EXPRESS, 2019, 卷号: 6, 期号: 10
作者:
Shi, Yujun
;
Lian, Jie
;
Wei, Xinjian
;
Jin, Kui
;
Song, Haonan
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  |  
浏览/下载:12/0
  |  
提交时间:2019/12/11
Pr2CuO4
dielectric fuction
spectroscopic ellipsometry
Study the relation between band gap value and lattice constant of MgTi2O4
期刊论文
JOURNAL OF ALLOYS AND COMPOUNDS, 2019, 卷号: 788, 页码: 891-896
作者:
Shi, Yujun
;
Lian, Jie
;
Hu, Wei
;
Liu, Yuxiang
;
He, Ge
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  |  
浏览/下载:16/0
  |  
提交时间:2019/12/11
MgTi2O4
Spectroscopic ellipsometry
Optical constants
Band gap
Study of the phase transition properties and electronic band structures of VO2 thin films grown on different substrates
期刊论文
MATERIALS RESEARCH EXPRESS, 2019, 卷号: 6, 期号: 2
作者:
Guo, Yunfeng
;
Zhang, Yuzhi
;
Zhang, Liangmiao
;
Lv, Xinrui
;
Wu, Lingnan
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  |  
浏览/下载:58/0
  |  
提交时间:2019/12/31
VO2
metal-to-insulator transition
spectroscopic ellipsometry
electronic structure
A comparative study of primary and secondary passive films formed on AM355 stainless steel in 0.1 M NaOH
期刊论文
APPLIED SURFACE SCIENCE, 2018, 卷号: 427, 页码: 763-773
作者:
Man, Cheng
;
Dong, Chaofang
;
Cui, Zhongyu
;
Xiao, Kui
;
Yu, Qiang
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  |  
浏览/下载:27/0
  |  
提交时间:2018/12/04
Transpassive Dissolution Mechanism
Time Spectroscopic Ellipsometry
Electrochemical-behavior
Oxide Layer
Growth
304-stainless-steel
Chloride
Water
Acid
Iron
A comparative study of primary and secondary passive films formed on AM355 stainless steel in 0.1 M NaOH
期刊论文
APPLIED SURFACE SCIENCE, 2018, 卷号: 427, 页码: 763-773
作者:
Man, Cheng
;
Dong, Chaofang
;
Cui, Zhongyu
;
Xiao, Kui
;
Yu, Qiang
收藏
  |  
浏览/下载:28/0
  |  
提交时间:2018/12/04
Transpassive Dissolution Mechanism
Time Spectroscopic Ellipsometry
Electrochemical-behavior
Oxide Layer
Growth
304-stainless-steel
Chloride
Water
Acid
Iron
Effect of Ar/O2 ratio on structure and cationic distribution of Mn1.56Co0.96Ni0.48O4 +/-delta spinel films
期刊论文
APPLIED SURFACE SCIENCE, 2017, 卷号: 405, 期号: 5, 页码: 47-51
作者:
Shi, Q (Shi, Qin)
;
Ren, W (Ren, Wei)
;
Zhang, XB (Zhang, Xiaobo)
;
Kong, WW (Kong, Wenwen)
;
Gao, B (Gao, Bo)
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  |  
浏览/下载:44/0
  |  
提交时间:2017/08/24
Thermistor thin film
XPS
Spectroscopic ellipsometry
O-2 partial pressure
Atomic hydrogen induced defect kinetics in amorphous silicon
期刊论文
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A, 2017
Peeters, Floran J. J.
;
Zheng, Jie
;
Aarts, Igor M. P.
;
Pipino, Andrew C. R.
;
Kessels, Wilhelmus M. M.
;
van de Sanden, Mauritius C. M.
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  |  
浏览/下载:4/0
  |  
提交时间:2017/12/03
A-SI-H
HOT-WIRE DEPOSITION
TIME SPECTROSCOPIC ELLIPSOMETRY
CAVITY RINGDOWN SPECTROSCOPY
MICROCRYSTALLINE SILICON
THIN-FILMS
INFRARED-SPECTROSCOPY
SI(100) SURFACES
DANGLING BONDS
CRYSTALLINE SILICON
Interband electronic transitions and phase diagram of PbZr1-xTixO3 (0.05 <= x <= 0.70) ceramics: ellipsometric experiment and first-principles theory
期刊论文
JOURNAL OF PHYSICS D-APPLIED PHYSICS, 2016, 卷号: 49, 期号: 27
作者:
Li, M. J.
;
Xu, L. P.
;
Shi, K.
;
Zhang, J. Z.
;
Chen, X. F.
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  |  
浏览/下载:16/0
  |  
提交时间:2017/02/24
electronic transitions
spectroscopic ellipsometry
first-principles calculations
phase diagram
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