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浏览/检索结果: 共5条，第1-5条 帮助 已选(0)清除 条数/页：5101520253035404550556065707580859095100   排序方式：请选择作者升序作者降序题名升序题名降序发表日期升序发表日期降序提交时间升序提交时间降序 A new nonlinear diffusion method to improve image quality (EI收录) 会议论文 Proceedings - International Conference on Image Processing, ICIP, San Antonio, TX, United states, September 16, 2007 - September 19, 2007 作者:  Zhang, Yue[1];  Xu, Xiaoyin[2];  Cai, Hongmin[3];  Yung, S.P.[3];  Wong, Stephen T. C.[2,4] 收藏  |  浏览/下载：7/0  |  提交时间：2019/04/18 Aircraft engines  Digital image storage  Image enhancement  Image processing  Image quality  Imaging systems  Magnetic resonance imaging  Partial differential equations   Probing process-induced defects in Si using infrared photoelastic stress measurement technique (EI收录) 会议论文 Materials Research Society Symposium Proceedings, San Francisco, CA, United states, March 28, 2005 - April 1, 2005 作者:  Liu, X.H.[1,3];  Wong, S.P.[1,3];  Peng, H.J.[1];  Ke, N.[1,3];  Zhao, Shounan[2] 收藏  |  浏览/下载：3/0  |  提交时间：2019/04/18 Birefringence  Photoelasticity  Silicon  Stress analysis   Stress distribution in ultra thin SiO2 film/Si substrate system measured by a low level birefringence detection technique (EI收录) 会议论文 Materials Research Society Symposium Proceedings, San Francisco, CA, United states, April 13, 2004 - April 16, 2004 作者:  Liu, X.H.[1];  Peng, H.J.[1];  Wong, S.P.[1];  Zhao, Shounan[2] 收藏  |  浏览/下载：1/0  |  提交时间：2019/04/18 Bimetals  Birefringence  Elastic moduli  Light sources  Oxidation  Phase interfaces  Poisson ratio  Stress concentration  Strip metal  Substrates  Thermal effects  Thermal expansion  Ultrathin films  Vectors   Low level birefringence detection system for stress measurement in semiconductors (EI收录) 会议论文 Proceedings of SPIE - The International Society for Optical Engineering, Munich, Germany, June 23, 2003 - June 26, 2003 作者:  Peng, H.J.[1];  Wong, S.P.[1];  Liu, X.H.[1];  Lai, Y.W.[1];  Ho, H.P.[1] 收藏  |  浏览/下载：4/0  |  提交时间：2019/04/19 Angle measurement  Light modulation  Photoelasticity  Semiconducting silicon   A new nonlinear diffusion method to improve image quality 会议论文 San Antonio, TX, United states, September 16, 2007 - September 19, 2007 作者:  Zhang, Yue[1];  Xu, Xiaoyin[2];  Cai, Hongmin[3];  Yung, S.P.[3];  Wong, Stephen T. C.[2,4] 收藏  |  浏览/下载：1/0  |  提交时间：2019/12/10