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Nanoscale imaging of Li and B in nuclear waste glass, a comparison of ToF-SIMS, NanoSIMS, and APT 期刊论文
SURFACE AND INTERFACE ANALYSIS, 2016, 卷号: 48, 期号: 13, 页码: 1392-1401
作者:  Wang, Zhaoying;  Liu, Jia;  Zhou, Yufan;  Neeway, James J.;  Schreiber, Daniel K.
收藏  |  浏览/下载:23/0  |  提交时间:2017/01/18
Nanoscale imaging of Li and B in nuclear waste glass, a comparison of ToF-SIMS, NanoSIMS, and APT 期刊论文
SURFACE AND INTERFACE ANALYSIS, 2016, 卷号: 48, 期号: 13, 页码: 1392-1401
作者:  Wang, Zhaoying;  Liu, Jia;  Zhou, Yufan;  Neeway, James J.;  Schreiber, Daniel K.
收藏  |  浏览/下载:5/0  |  提交时间:2019/12/16
Argon Cluster Sputtering Source for ToF-SIMS Depth Profiling of Insulating Materials: High Sputter Rate and Accurate Interfacial Information 期刊论文
JOURNAL OF THE AMERICAN SOCIETY FOR MASS SPECTROMETRY, 2015, 卷号: 26, 期号: 8, 页码: 1283-1290
作者:  Wang, Zhaoying;  Liu, Bingwen;  Zhao, Evan W.;  Jin, Ke;  Du, Yingge
收藏  |  浏览/下载:20/0  |  提交时间:2015/10/27
Low-temperature lithium diffusion in simulated high-level boroaluminosilicate nuclear waste glasses 期刊论文
JOURNAL OF NON-CRYSTALLINE SOLIDS, DEC , 卷号: 405, 页码: 83-90
作者:  Neeway, James J.;  Kerisit, Sebastien;  Gin, Stephane;  Wang, Zhaoying;  Zhu, Zihua
收藏  |  浏览/下载:9/0  |  提交时间:2018/04/10


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