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CORC

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Engineering and Microscopic Mechanism of Quantum Emitters Induced by Heavy Ions in hBN 期刊论文
ACS PHOTONICS, 2021, 卷号: 8, 期号: 10, 页码: 2912-2922
作者:  Gu, Rui;  Wang, Lei;  Zhu, Huiping;  Han, Shuangping;  Bai, Yurong
收藏  |  浏览/下载：35/0  |  提交时间：2021/12/13
Radiation effects of heavy ions on the static and dynamic characteristics of 850 nm high-speed vertical cavity surface emitting lasers 期刊论文
JOURNAL OF LUMINESCENCE, 2021, 卷号: 237, 页码: 7
作者:  Shan, Xiaoting;  Li, Bo;  Zhao, Fazhan;  Wang, Lei;  Sun, Yun
收藏  |  浏览/下载：28/0  |  提交时间：2021/12/09
Comparison of X-Ray and Proton Irradiation Effects on the Characteristics of InGaN/GaN Multiple Quantum Wells Light-Emitting Diodes 期刊论文
IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 2020, 卷号: 67, 期号: 7, 页码: 1345-1350
作者:  Lei Wang ;   Ningyang Liu;   Bo Li ;   Huiping Zhu;   Xiaoting Shan;   Qingxi Yuan;   Xuewen Zhang;   Zheng Gong;   Fazhan Zhao ;   Naixin Liu;   Mengxin Liu;   Binhong Li;   Jiantou Gao;   Yang Huang ;   Jianqun Yang;   Xingji Li;   Jiajun Luo;   Zhengsheng Han, and Xinyu
收藏  |  浏览/下载：22/0  |  提交时间：2021/06/28
Total Ionizing Dose Response and Annealing Behavior of Bulk nFinFETs With ON-State Bias Irradiation 期刊论文
IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 2018, 卷号: 65, 期号: 8, 页码: 1503-1510
作者:  Yang, L (Yang, Ling)[ 1,2 ];  Zhang, QZ (Zhang, Qingzhu)[ 1,3 ];  Huang, YB (Huang, Yunbo)[ 1,2 ];  Zheng, ZS (Zheng, Zhongshan)[ 1,2 ];  Li, B (Li, Bo)[ 1,2 ]
收藏  |  浏览/下载：35/0  |  提交时间：2018/09/18
An Effective Method to Compensate Total Ionizing Dose-Induced Degradation on Double-SOI Structure 会议论文
作者:  Huang, Yang;  Li, Binhong;  Zhao, Xing;  Zheng, Zhongshan;  Gao, Jiantou
收藏  |  浏览/下载：16/0  |  提交时间：2019/11/26
Multiple Angle Analysis of 30-MeV Silicon Ion Beam Radiation Effects on InGaN/GaN Multiple Quantum Wells Blue Light-Emitting Diodes 期刊论文
IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 2018, 卷号: 65, 期号: 11, 页码: 2784-2792
作者:  Liu, Ningyang;  Wang, Lei;  Song LG(宋力刚);  Cao XZ(曹兴忠);  Wang BY(王宝义)
收藏  |  浏览/下载：43/0  |  提交时间：2019/10/11
Investigation of Threshold Ion Range for Accurate Single Event Upset Measurements in Both SOI and Bulk Technologies 期刊论文
IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 2014, 卷号: 61, 页码: 1459-1467
作者:  Luo, Jie;  Yao, Huijun;  Sun, Youmei;  Xi, Kai;  Geng, Chao
收藏  |  浏览/下载：19/0  |  提交时间：2018/07/05
Influence of Deposited Energy in Sensitive Volume on Temperature Dependence of SEU Sensitivity in SRAM Devices 会议论文
作者:  Liu, Tianqi;  Geng, Chao;  Zhang, Zhangang;  Zhao, Fazhan;  Hou, Mingdong
收藏  |  浏览/下载：29/0  |  提交时间：2018/08/20
Influence of Deposited Energy in Sensitive Volume on Temperature Dependence of SEU Sensitivity in SRAM Devices 会议论文
作者:  Liu, Jie;  Sun, Youmei;  Tong, Teng;  Zhao, Fazhan;  Zhang, Zhangang
收藏  |  浏览/下载：16/0  |  提交时间：2018/08/20
Testing of grain hardness based on indentation loading curve 期刊论文
Nongye Jixie Xuebao/Transactions of the Chinese Society of Agricultural Machinery, 2010, 卷号: 41, 期号: 4, 页码: 128-133
作者:  Zhang, Fengwei;  Zhao, Chunhua;  Guo, Weijun;  Zhao, Wuyun;  Feng, Yongzhong
收藏  |  浏览/下载：12/0  |  提交时间：2020/11/14

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