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长春光学精密机械与物... [1]
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会议论文 [1]
发表日期
2006 [1]
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Chip design of linear CCD drive pulse generator and control interface (EI CONFERENCE)
会议论文
2nd International Symposium on Advanced Optical Manufacturing and Testing Technologies - Advanced Optical Manufacturing and Testing Technologies, November 2, 2005 - November 5, 2005, Xian, China
Cai R.
;
Sun H.
;
Wang Y.
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提交时间:2013/03/25
CCD noises and their causes are analyzed. Methods to control these noises
such as Correlated Double Sampling (CDS)
filtering
cooling
clamping
and calibration are proposed. To improve CCD sensor's performances
the IC
called Analog Front End (AFE)
integration of CDS
clamping
Programmable Gain Amplifier (PGA)
offset
and ADC
which can fulfill the CDS and analog-to-digital conversion
is employed to process the output signal of CCD. Based on the noise control approaches
the idea of chip design of linear CCD drive pulse generator and control interface is introduced. The chip designed is playing the role of (1) drive pulse generator
for both CCD and AFE
and (2) interface
helping to analysis and transfer control command and status information between MCU controller and drive pulse generator
or between global control unit in the chip and CCD/AFE. There are 6 function blocks in the chip designed
such as clock generator for CCD and AFE
MCU interface
AFE serial interface
output interface
CCD antiblooming parameter register and global control logic unit. These functions are implemented in a CPLD chip
Xilinx XC2C256-6-VQ100
with 20MHz pixel frequency
and 16-bit high resolution. This chip with the AFE can eliminate CCD noise largely and improve the SNR of CCD camera. At last
the design result is presented.
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