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Impact of energy straggle on proton-induced single event upset test in a 65-nm SRAM cell 期刊论文
CHINESE PHYSICS B, 2017, 卷号: 26, 页码: 6
作者:  Ye, Bing;  Liu, Jie;  Wang, Tie-Shan;  Liu, Tian-Qi;  Luo, Jie
收藏  |  浏览/下载:19/0  |  提交时间:2018/05/31
Investigation of electrons inside the satellite by the Geant4 simulation 期刊论文
science china technological sciences, 2011
Li XiaoCan; Chen HongFei; Hao YongQiang; Zou Hong; Shi WeiHong
收藏  |  浏览/下载:3/0  |  提交时间:2015/11/10


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