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CORC

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Numerical Analysis on RHEED Patterns Based on Gray Level: a Case Study of IBAD-MgO Film 会议论文
IEEE International Conference on Applied Superconductivity and Electromagnetic Devices (ASEMD), 2015-01-01
作者:  Shi, Xiao Liang[1];  Fan, Feng[2];  Guo, Yan Qun[3];  Bai, Chuan Yi[4];  Lu, Yu Ming[5]
收藏  |  浏览/下载：2/0  |  提交时间：2019/04/26
Efficient entanglement purification in quantum repeaters 期刊论文
CHINESE PHYSICS B, 2012, 卷号: 21, 期号: 3
Sheng, YB; Zhou, L; Cheng, WW; Gong, LY; Zhao, SM; Zheng, BY
收藏  |  浏览/下载：22/0  |  提交时间：2013/09/17
High pressure RHEED study on the initial structure and growth dynamics of YBa2Cu3O7-delta thin films on SrTiO3 (001) 期刊论文
SOLID STATE COMMUNICATIONS, 2012, 卷号: 152, 期号: 6, 页码: 478
Li, J; Peng, W; Chen, K; Zhang, Y; Cui, LM; Chen, YF; Jin, YR; Zhang, YZ; Zheng, DN
收藏  |  浏览/下载：17/0  |  提交时间：2013/09/17
Improvement in crystal quality of zno film on si substrate by using a homo-buffer layer 期刊论文
Materials science in semiconductor processing, 2009, 卷号: 12, 期号: 6, 页码: 233-237
作者:  Zhao, Jie;  Hu, Lizhong
收藏  |  浏览/下载：32/0  |  提交时间：2019/05/12
Improvement in crystal quality of ZnO film on Si substrate by using a homo-buffer layer 期刊论文
MATERIALS SCIENCE IN SEMICONDUCTOR PROCESSING, 2009, 卷号: 12, 期号: 6, 页码: 233-237
作者:  Zhao, Jie;  Hu, Lizhong
收藏  |  浏览/下载：6/0  |  提交时间：2021/02/02
Improvement in crystal quality of ZnO film on Si substrate by using a homo-buffer layer 期刊论文
materials science in semiconductor processing, 2009, 卷号: 12, 期号: 6, 页码: 233-237
作者:  Zhao J
收藏  |  浏览/下载：44/4  |  提交时间：2011/07/05
Optimization of GaAs (110) quantum well material growth technology by reflection high energy electron diffraction 期刊论文
ACTA PHYSICA SINICA, 2007, 卷号: 56, 期号: 6, 页码: 3355
Liu, LS; Wang, WX; Zhao, HM; Liu, BL; Jiang, ZW; Wang, J; Huang, QA; Chen, H; Zhou, JM
收藏  |  浏览/下载：10/0  |  提交时间：2013/09/24
Growth and surface structure of vanadium oxide on anatase(001) 期刊论文
2004
Gao, W; Wang, CM; Wang, HQ; Henrich, VE; Altman, EI; 王惠琼
收藏  |  浏览/下载：3/0  |  提交时间：2013/12/12
In-situ monitoring of the growth of oxide thin films in PLID using high-pressure reflection high energy electron diffraction 期刊论文
ACTA PHYSICA SINICA, 2003, 卷号: 52, 期号: 10, 页码: 2601
Chen, YF; Peng, W; Li, J; Chen, K; Zhu, XH; Wang, P; Zeng, G; Zheng, DN; Li, L
收藏  |  浏览/下载：13/0  |  提交时间：2013/09/18
The evolution of 3 x 3, 6 x 6, root 3 x root 3R30 degrees and 6 root 3 x 6 root 3R30 degrees superstructuves on 6H-SiC (0001) surfaces studied by reflection high energy electron diffraction 期刊论文
2001
Xie, XN; Wang, HQ; Wee, ATS; Loh, KP; 王惠琼
收藏  |  浏览/下载：3/0  |  提交时间：2013/12/12

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