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| Self-heating Enhanced HCI Degradation in pLDMOSFETs 其他
2015-01-01
He, Yandong; Zhang, Ganggang; Zhang, Xing
  收藏 | 浏览/下载：2/0 | 提交时间：2017/12/03
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| Understanding of HCI degradation temperature dependence in SOI STI-pLDMOSFETs from MR-DCIV spectroscopy 其他
2015-01-01
He, Yandong; Zhang, Ganggang; Zhang, Xing
收藏 | 浏览/下载：5/0 | 提交时间：2017/12/03 |
| Understanding of HCI Degradation Temperature Dependence in SOI STI-pLDMOSFETs from MR-DCIV Spectroscopy 其他
2015-01-01
He, Yandong; Zhang, Ganggang; Zhang, Xin
收藏 | 浏览/下载：6/0 | 提交时间：2017/12/03
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| NBTI degradation in STI-based LDMOSFETs 其他
2014-01-01
He, Yandong; Zhang, Ganggang; Zhang, Xing
收藏 | 浏览/下载：7/0 | 提交时间：2015/11/10
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| High temperature behavior of multi-region direct current current-voltage spectroscopy and relationship with shallow-trench-isolation-based high-voltage laterally diffused metal-oxide-semiconductor field-effect-transistors reliability 期刊论文
日本应用物理学杂志, 2014
He, Yandong; Zhang, Ganggang; Zhang, Xing
收藏 | 浏览/下载：3/0 | 提交时间：2015/11/10
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| SOI高压器件热载流子退化研究 期刊论文
北京大学学报 自然科学版, 2014
韩临; 何燕冬; 张钢刚
收藏 | 浏览/下载：7/0 | 提交时间：2015/11/11
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| High temperature behavior of multi-region direct current current-voltage spectroscopy and relationship with shallow-trench-isolation-based high-voltage laterally diffused metal-oxide-semiconductor field-effect-transistors reliability 其他
2014-01-01
He, Yandong; Zhang, Ganggang; Zhang, Xing
收藏 | 浏览/下载：5/0 | 提交时间：2017/12/03 |
| Understanding the Correlation of HCI and NBTI Degradation in pLDMOSFETs from MR-DCIV Technique 其他
2014-01-01
He, Yandong; Zhang, Ganggang; Zhang, Xing
收藏 | 浏览/下载：11/0 | 提交时间：2015/11/13
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| Understanding of self-heating enhanced degradation in pLDMOSFETs by MR-DCIV method 其他
2014-01-01
He, Yandong; Zhang, Ganggang; Zhang, Xing
收藏 | 浏览/下载：1/0 | 提交时间：2015/11/13 |
| Correlation between MR-DCIV Current and High-Voltage-Stress-Induced Degradation in LDMOSFETs 其他
2013-01-01
He, Yandong; Han, Lin; Zhang, Ganggang; Zhang, Xing
收藏 | 浏览/下载：4/0 | 提交时间：2015/11/13
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