CORC

在结果中检索

CORC

浏览/检索结果: 共19条，第1-10条 帮助

已选(0)清除 条数/页：   排序方式：
An Oxide Chemical Mechanical Planarization Model for HKMG Structures 期刊论文
ECS Journal of Solid State Science and Technology, 2018
作者:  Sun Y(孙艳);  Liu HW(刘宏伟);  Chen L(陈岚);  Xu QZ(徐勤志);  Yang F(杨飞)
收藏  |  浏览/下载：8/0  |  提交时间：2019/04/25
Comparative Investigation of Flat-Band Voltage Modulation by Nitrogen Plasma Treatment for Advanced HKMG Technology 期刊论文
ECS Journal of Solid State Science and Technology, 2018
作者:  Zhang QZ(张青竹);  Yao JX(姚佳欣);  Yin HX(殷华湘);  Wu ZH(吴振华);  Gao JF(高建峰)
收藏  |  浏览/下载：52/0  |  提交时间：2019/05/05
Adding the missing time-dependent layout dependency into device-circuit-layout co-optimization-New findings on the layout dependent aging effects 其他
2016-01-01
Ren, Pengpeng; Xu, Xiaoqing; Hao, Peng; Wang, Junyao; Wang, Runsheng; Li, Ming; Wang, Jianping; Bu, Weihai; Wu, Jingang; Wong, Waisum; Yu, Shaofeng; Wu, Hanming; Lee, Shiuh-Wuu; Pan, David Z.; Huang, Ru
收藏  |  浏览/下载：11/0  |  提交时间：2017/12/03
Layout dependent BTI and HCI degradation in nano CMOS technology: A new time-dependent LDE and impacts on circuit at end of life 其他
2016-01-01
Ren, Pengpeng; Wang, Runsheng; Huang, Ru
收藏  |  浏览/下载：3/0  |  提交时间：2017/12/03
Self-selection RRAM Cell with Sub-mu A Switching Current and Robust Reliability Fabricated by High-K/Metal Gate CMOS Compatible Technology 其他
2016-01-01
Huang, Peng; Chen, Sijie; Zhao, Yudi; Chen, Bing; Gao, Bin; Liu, Lifeng; Liu, Xiaoyan; Kang, Jinfeng
收藏  |  浏览/下载：2/0  |  提交时间：2017/12/03
Self-Selection RRAM Cell With Sub-mu A Switching Current and Robust Reliability Fabricated by High-K/Metal Gate CMOS Compatible Technology 期刊论文
IEEE TRANSACTIONS ON ELECTRON DEVICES, 2016
Huang, Peng; Chen, Sijie; Zhao, Yudi; Chen, Bing; Gao, Bin; Liu, Lifeng; Chen, Yong; Zhang, Ziying; Bu, Weihai; Wu, Hanming; Liu, Xiaoyan; Kang, Jinfeng
收藏  |  浏览/下载：9/0  |  提交时间：2017/12/03
Attainment of dual-band edge work function by using a single metal gate and single high-k dielectric via ion implantation for HP CMOS device 期刊论文
Solid-State Electronics, 2016
作者:  Xu GB(许高博);  Zhou HJ(周华杰);  Zhu HL(朱慧珑);  Liu JB(刘金彪);  Wang Y(王垚)
收藏  |  浏览/下载：26/0  |  提交时间：2017/05/09
Investigation of TaN as the wet etch stop layer for HKMG-last integration in the 22 nm and beyond nodes CMOS technology 期刊论文
Vacuum, 2015
作者:  Cui HS(崔虎山);  Luo J(罗军);  Xu J(许静);  Gao JF(高建峰);  Xiang JJ(项金娟)
收藏  |  浏览/下载：20/0  |  提交时间：2016/05/31
Adding the Missing Time-Dependent Layout Dependency into Device-Circuit-Layout Co-Optimization -New Findings on the Layout Dependent Aging Effects 其他
2015-01-01
Ren, Pengpeng; Xu, Xiaoqing; Hao, Peng; Wang, Junyao; Wang, Runsheng; Li, Ming; Wang, Jianping; Bu, Weihai; Wu, Jingang; Wong, Waisum; Yu, Shaofeng; Wu, Hanming; Lee, Shiuh-Wuu; Pan, David Z.; Huang, Ru
收藏  |  浏览/下载：3/0  |  提交时间：2017/12/03
3D KMC reliability simulation of nano-scaled HKMG nMOSFETs with multiple traps coupling 其他
2015-01-01
Li, Yun; Lun, Zhiyuan; Huang, Peng; Wang, Yijiao; Jiang, Hai; Du, Gang; Liu, Xiaoyan
收藏  |  浏览/下载：8/0  |  提交时间：2017/12/03

©版权所有 ©2017 CSpace - Powered by CSpace