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浏览/检索结果: 共6条，第1-6条 帮助 已选(0)清除 条数/页：5101520253035404550556065707580859095100   排序方式：请选择作者升序作者降序题名升序题名降序发表日期升序发表日期降序提交时间升序提交时间降序 Verification of SEU resistance in 65 nm high-performance SRAM with dual DICE interleaving and EDAC mitigation strategies 期刊论文 NUCLEAR SCIENCE AND TECHNIQUES, 2021, 卷号: 32, 期号: 12, 页码: 13 作者:  He, Ze;  Zhao, Shi-Wei;  Liu, Tian-Qi;  Cai, Chang;  Yan, Xiao-Yu 收藏  |  浏览/下载：68/0  |  提交时间：2022/01/12 Double interlocked storage cell (DICE)  Error detection and correction (EDAC) code  Heavy ion  Radiation hardening technology  Single event upset (SEU)  Static random-access memory (SRAM)   Multiple Layout-Hardening Comparison of SEU-Mitigated Filp-Flops in 22-nm UTBB FD-SOI Technology 期刊论文 IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 2020, 卷号: 67, 期号: 1, 页码: 374-381 作者:  Cai, Chang;  Liu, Tianqi;  Zhao, Peixiong;  Fan, Xue;  Huang, Hongyang 收藏  |  浏览/下载：23/0  |  提交时间：2022/01/19 D filp-flops (DFFs)  heavy ions  radiation hardening  single-event upsets (SEUs)  ultrathin body and buried oxide fully depleted silicon on insulator (UTBB FDSOI)   The Increased Single-Event Upset Sensitivity of 65-nm DICE SRAM Induced by Total Ionizing Dose 会议论文 Geneva, SWITZERLAND, OCT 02-06, 2017 作者:  Zheng, Qiwen;  Cui, Jiangwei;  Lu, Wu;  Guo, Hongxia;  Liu, Jie 收藏  |  浏览/下载：38/0  |  提交时间：2018/10/08 Charge sharing  single-event upset (SEU)  static random access memory  total ionizing dose (TID)   The Increased Single-Event Upset Sensitivity of 65-nm DICE SRAM Induced by Total Ionizing Dose 期刊论文 IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 2018, 卷号: 65, 期号: 8, 页码: 1920-1927 作者:  Zheng, QW (Zheng, Qiwen)[ 1 ];  Cui, JW (Cui, Jiangwei)[ 1 ];  Lu, W (Lu, Wu)[ 1 ];  Guo, HX (Guo, Hongxia)[ 1 ];  Liu, J (Liu, Jie)[ 2 ] 收藏  |  浏览/下载：53/0  |  提交时间：2018/09/27 Charge Sharing  Single-event Upset (Seu)  Static Random Access Memory  Total Ionizing Dose (Tid)   Azimuthal dependence of single-event and multiple-bit upsets in SRAM devices with anisotropic layout 期刊论文 NUCLEAR SCIENCE AND TECHNIQUES, 2015, 卷号: 26, 页码: 7 作者:  Duan Jing-Lai;  En Yun-Fei;  Xi Kai;  Mo Dan;  Luo Jie 收藏  |  浏览/下载：14/0  |  提交时间：2018/05/31 Azimuth  Dual interlocked cell  Multiple-bit upset  Single event upset   Nonvolatile Radiation Hardened DICE Latch 会议论文 2015 15TH NON-VOLATILE MEMORY TECHNOLOGY SYMPOSIUM (NVMTS), 2015-01-01 作者:  Pang, Tingting;  Kang, Wang;  Ran, Yi;  Zhang, Youguang;  Lv, Weifeng 收藏  |  浏览/下载：2/0  |  提交时间：2020/01/06 Dual interlocked storage cell (DICE)  nonvolatility  single event upset (SEU)  radiation hardened design