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Prediction model of lifetime for copper pillar bumps under coupling effects of current and thermal cycling 期刊论文
JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS, 2016, 卷号: 27, 期号: 2, 页码: 1184-1190
Ma, Huicai; Guo, Jingdong; Chen, Jianqiang; Wu, Di; Liu, Zhiquan; Zhu, Qingsheng; Shang, Jianku; Zhang, Li; Guo, Hongyan
收藏  |  浏览/下载:32/0  |  提交时间:2016/04/21
Research on thermal-electric coupling effect of the Copper Pillar Bump in the Flip Chip Packaging (CPCI-S收录) 会议
作者:  Fu Zhiwei[1,2];  Zhou Bin[1,2];  Yao Ruohe[1];  Li Xunping[2]
收藏  |  浏览/下载:2/0  |  提交时间:2019/04/11


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