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	Stable compositions and structures in the Na-Bi system 期刊论文 Physical Chemistry Chemical Physics, 2015, 卷号: 17, 期号: 10, 页码: 6933-6947 X. Y.; Li Cheng, R. H.; Li, D. Z.; Li, Y. Y.; Chen, X. Q. 收藏 \| 浏览/下载：33/0 \| 提交时间：2015/05/08 crystal-structure prediction high-pressure 1st principles energy landscape electron localization phase-transition single-crystal dense sodium 100 gpa lithium
	Hierarchically Porous Carbon with Manganese Oxides as Highly Efficient Electrode for Asymmetric Supercapacitors 期刊论文 Chemsuschem, 2014, 卷号: 7, 期号: 3, 页码: 841-847 T. C. Chou; R. A. Doong; C. C. Hu; B. S. Zhang; D. S. Su 收藏 \| 浏览/下载：27/0 \| 提交时间：2014/07/03 cyclic voltammetry electrochemistry electron microscopy materials science nanostructures electrochemical energy-storage hydrothermal synthesis mno2 nanoparticles mesoporous carbon cell voltage high-power capacitors performance composites dioxide
	Research on the thermal shifts and electron-phonon coupling parameters of R-line for Cr3+ and Mn4+ ions in YAlO3 crystals 期刊论文 Journal of Luminescence, 2013, 卷号: 138, 页码: 214-217 W. C. Zheng; B. X. Li; G. Y. Feng; H. G. Liu 收藏 \| 浏览/下载：22/0 \| 提交时间：2013/12/24 Luminescence Thermal shift Electron-phonon coupling parameter Cr3+ Mn4+ YAlO3 temperature-dependence single-crystals spectral-lines energy-levels high-pressure nd3+ ions excitation linewidths centers
	Growth and annealing of zinc-blende CdSe thin films on GaAs (001) by molecular beam epitaxy 期刊论文 APPLIED SURFACE SCIENCE, 2011, 卷号: 257, 期号: 21, 页码: 9038-9043 作者: Yang, Qiumin; Zhao, Jie; Guan, Min; Liu, Chao; Cui, Lijie 收藏 \| 浏览/下载：14/0 \| 提交时间：2021/02/02 CdSe Molecular beam epitaxy Reflection high energy electron diffraction X-ray diffraction Atomic force microscopy
	Growth and annealing of zinc-blende CdSe thin films on GaAs (001) by molecular beam epitaxy 期刊论文 APPLIED SURFACE SCIENCE, 2011, 卷号: 257, 期号: 21, 页码: 9038-9043 作者: Yang, Qiumin; Zhao, Jie; Guan, Min; Liu, Chao; Cui, Lijie 收藏 \| 浏览/下载：38/0 \| 提交时间：2021/02/02 CdSe Molecular beam epitaxy Reflection high energy electron diffraction X-ray diffraction Atomic force microscopy
	VI/II ratio-dependent growth and photoluminescence of cubic CdSe epilayers by molecular beam epitaxy 期刊论文 JOURNAL OF CRYSTAL GROWTH, 2011, 卷号: 329, 期号: 1, 页码: 1-5 作者: Zhao, Jie; Zeng, Yiping; Yang, Qiumin; Li, Yiyang; Cui, Lijie 收藏 \| 浏览/下载：8/0 \| 提交时间：2021/02/02 Reflection high-energy electron diffraction X-ray diffraction Atomic force microscopy Molecular beam epitaxy Cadmium compounds Semiconducting II-VI materials
	VI/II ratio-dependent growth and photoluminescence of cubic CdSe epilayers by molecular beam epitaxy 期刊论文 JOURNAL OF CRYSTAL GROWTH, 2011, 卷号: 329, 期号: 1, 页码: 1-5 作者: Zhao, Jie; Zeng, Yiping; Yang, Qiumin; Li, Yiyang; Cui, Lijie 收藏 \| 浏览/下载：9/0 \| 提交时间：2021/02/02 Reflection high-energy electron diffraction X-ray diffraction Atomic force microscopy Molecular beam epitaxy Cadmium compounds Semiconducting II-VI materials
	Structural and microstructural analyses of crystalline Er2O3 high-k films grown on Si (001) by laser molecular beam epitaxy 期刊论文 ACTA MATERIALIA, 2011, 卷号: 59, 期号: 4, 页码: 1644-1650 作者: Wang, X.; Zhu, Y. L.; He, M.; Lu, H. B.; Ma, X. L. 收藏 \| 浏览/下载：11/0 \| 提交时间：2021/02/02 Thin films High-resolution electron microscopy Energy-filtered transmission microscopy Interface Dielectrics
	Quantifying the Microstructures of Pure Cu Subjected to Dynamic Plastic Deformation at Cryogenic Temperature 期刊论文 Journal of Materials Science & Technology, 2011, 卷号: 27, 期号: 8, 页码: 673-679 F. Yan; H. W. Zhang; N. R. Tao; K. Lu 收藏 \| 浏览/下载：12/0 \| 提交时间：2012/04/13 Quantitative structural characterization Cu Dynamic plastic deformation Transmission electron microscopy Convergent beam electron diffraction channel angular extrusion fine grained copper ultra-high strains mechanical-properties thermal-stability rate sensitivity stored energy evolution strength size
	Structural and microstructural analyses of crystalline Er(2)O(3) high-k films grown on Si (001) by laser molecular beam epitaxy 期刊论文 Acta Materialia, 2011, 卷号: 59, 期号: 4, 页码: 1644-1650 X. Wang; Y. L. Zhu; M. He; H. B. Lu; X. L. Ma 收藏 \| 浏览/下载：8/0 \| 提交时间：2012/04/13 Thin films High-resolution electron microscopy Energy-filtered transmission microscopy Interface Dielectrics thin-films electrical-properties oxide-films silicon si(001) dielectrics interface

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