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Analysis of Dark Signal Degradation Caused by 1 MeV Neutron Irradiation on Backside-Illuminated CMOS Image Sensors 期刊论文
CHINESE JOURNAL OF ELECTRONICS, 2021, 卷号: 30, 期号: 1, 页码: 180-184
作者:  Liu, BK (Liu Bingkai)[ 1,2,3 ];  Li, YD (Li Yudong)[ 1,2 ];  Wen, L (Wen Lin)[ 1,2 ];  Zhou, D (Zhou Dong)[ 1,2 ];  Feng, J (Feng Jie)[ 1,2 ]
收藏  |  浏览/下载:32/0  |  提交时间:2021/05/10
Investigation on the lateral impact responses of circular concrete-filled double-tube (CFDT) members 期刊论文
Composite Structures, 2021, 卷号: 255
作者:  Xian, Wei;  Chen, Wensu;  Hao, Hong;  Wang, Wen-Da;  Wang, Rui
收藏  |  浏览/下载:11/0  |  提交时间:2020/11/14
Investigation on the lateral impact responses of circular concrete-filled double-tube (CFDT) members 期刊论文
Composite Structures, 2021, 卷号: 255
作者:  Xian, Wei;  Chen, Wensu;  Hao, Hong;  Wang, Wen-Da;  Wang, Rui
收藏  |  浏览/下载:8/0  |  提交时间:2021/03/02


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