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In situ surface topography measurement method of granite base in scanning wafer stage with laser interferometer 期刊论文
optik, 2012, 卷号: 119, 期号: 1
He, L (He, Le); Wang, XZ (Wang, Xiangzhao); Shi, WJ (Shi, Weijie)
收藏  |  浏览/下载:11/0  |  提交时间:2013/09/17
In situ surface topography measurement method of granite base in scanning wafer stage with laser interferometer 期刊论文
optik, 2012, 期号: 1
He, L (He, Le); Wang, XZ (Wang, Xiangzhao); Shi, WJ (Shi, Weijie)
收藏  |  浏览/下载:8/0  |  提交时间:2013/09/17
In situ surface topography measurement method of granite base in scanning wafer stage with laser interferometer 期刊论文
optik, 2008, 卷号: 119, 期号: 1, 页码: 1, 6
He Le; 王向朝; Shi Weijie
收藏  |  浏览/下载:925/143  |  提交时间:2009/09/18
A novel method for measuring the coma of a lithographic projection system by use of mirror-symmetry marks 期刊论文
opt. laser technol., 2007, 卷号: 39, 期号: 5, 页码: 922, 925
Zhang Dongqing; 王向朝; Shi Weijie; Wang Fan
收藏  |  浏览/下载:1534/510  |  提交时间:2009/09/18
A novel method to determine the FOCAL energy range 期刊论文
chin. opt. lett., 2005, 卷号: 3, 期号: 10, 页码: 589, 592
Dongqing Zhang; 王向朝; Weijie Shi
收藏  |  浏览/下载:1353/250  |  提交时间:2009/09/18
Flexible Pupil Correction Technology for Photolithography Machine 期刊论文
SIXTH INTERNATIONAL CONFERENCE ON OPTICAL AND PHOTONIC ENGINEERING (ICOPEN 2018), 卷号: 10827
作者:  Zhu Siyu;  Niu Zhiyuan;  Zhang Fang;  Ma Xiaozhe;  Zeng Zongshun
收藏  |  浏览/下载:15/0  |  提交时间:2018/12/25
An Excellent Performance Optical System for Freeform Pupil Illumination Module in Immersion Photolithography Machine 期刊论文
SIXTH INTERNATIONAL CONFERENCE ON OPTICAL AND PHOTONIC ENGINEERING (ICOPEN 2018), 卷号: 10827
作者:  Zeng Zongshun;  Niu Zhiyuan;  Zhang Fang;  Ma Xiaozhe;  Zhu Siyu
收藏  |  浏览/下载:12/0  |  提交时间:2018/12/25


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