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A Fast Vth Measurement Technique for NBTI Behavior Characterization. 期刊论文
IEEE Electron Device Letters, 2018, 卷号: Vol.39 No.2, 页码: 172-175
作者:  Yu, Xiao;  Cheng, Ran;  Liu, Wei;  Qu, Yiming;  Han, Jinghui
收藏  |  浏览/下载:6/0  |  提交时间:2019/12/26
A Fast Vth Measurement (FVM) Technique for NBTI Behavior Characterization 期刊论文
IEEE Electron Device Letters, 2018, 卷号: Vol.39 No.2, 页码: 172-175
作者:  Xiao Yu;  Ran Cheng;  Wei Liu;  Yiming Qu;  Jinghui Han
收藏  |  浏览/下载:3/0  |  提交时间:2019/12/26
A Fast Vth Measurement (FVM) Technique for NBTI Behavior Characterization 期刊论文
IEEE Electron Device Letters, 2018, 卷号: Vol.39 No.2, 页码: 172-175
作者:  Yu, Xiao;  Cheng, Ran;  Liu, Wei;  Qu, Yiming;  Han, Jinghui
收藏  |  浏览/下载:6/0  |  提交时间:2019/12/26
Influence of Stabilizing Annealing on Properties and Texture Evolution of 5B01 Alloy 期刊论文
Special Casting & Non-ferrous Alloys, 2012, 卷号: Vol.32 No.10, 页码: 945-948
作者:  Zhao Yi;  Huang Jiwu;  Hu Jian;  Fu Le;  Jian Haigen
收藏  |  浏览/下载:2/0  |  提交时间:2020/01/05
Ultra fast (<1 ns) electrical characterization of self-heating effect and its impact on hot carrier injection in 14nm FinFETs 会议论文
63rd IEEE International Electron Devices Meeting, IEDM 2017, San Francisco, CA, United states, 2017
作者:  Qu, Yiming;  Lin, Xi;  Li, Junkang;  Cheng, Ran;  Yu, Xiao
收藏  |  浏览/下载:4/0  |  提交时间:2019/12/26


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