CORC

浏览/检索结果: 共15条,第1-10条 帮助

限定条件                
已选(0)清除 条数/页:   排序方式:
Trapped-charge-effect-based above-threshold current expressions for amorphous silicon tfts consistent with pao-sah model (EI收录SCI收录) 期刊论文
IEEE Transactions on Electron Devices, 2014, 卷号: 61, 页码: 3744-3750
作者:  He, Hongyu[1,2];  He, Jin[3];  Deng, Wanling[4];  Wang, Hao[5];  Liu, Yuan[6]
收藏  |  浏览/下载:7/0  |  提交时间:2019/04/25
A physics-based charge sheet model of polysilicon thin film transistors for circuit simulation (EI收录) 会议论文
AD'07 - Proceedings of Asia Display 2007, Shanghai, China, March 12, 2007 - March 16, 2007
作者:  Deng, Wanling[1];  Zheng, Xueren[1];  Chen, Rongsheng[1];  Wu, Weijing[1]
收藏  |  浏览/下载:2/0  |  提交时间:2019/04/17
Thermal resistance calculation method of high-power LEDs (EI收录) 会议论文
AD'07 - Proceedings of Asia Display 2007, Shanghai, China, March 12, 2007 - March 16, 2007
作者:  Ma, Zhiling[1];  Zheng, Xueren[1]
收藏  |  浏览/下载:1/0  |  提交时间:2019/04/17
A physics-based charge sheet model of polysilicon thin film transistors for circuit simulation (CPCI-S收录) 会议论文
AD'07: Proceedings of Asia Display 2007, Vols 1 and 2
作者:  Deng, Wanling;  Zheng, Xueren;  Chen, Rongsheng;  Wu, Weijing
收藏  |  浏览/下载:0/0  |  提交时间:2019/04/17
Thermal resistance calculation method of high-power LEDs (CPCI-S收录) 会议论文
AD'07: PROCEEDINGS OF ASIA DISPLAY 2007, VOLS 1 AND 2
作者:  Ma, Zhiling;  Zheng, Xueren
收藏  |  浏览/下载:1/0  |  提交时间:2019/04/17
Simple leakage Current and 1/f Noise Expressions for Polycrystalline Silicon Thin-Film Transistors (CPCI-S收录) 会议
作者:  He, Hongyu[1,2];  Deng, Wanling[3];  Liu, Yuan[4];  Lin, Xinnan[2];  Zheng, Xueren[5]
收藏  |  浏览/下载:1/0  |  提交时间:2019/04/11
Simple leakage current and 1/f noise expressions for polycrystalline silicon thin-film transistors (EI收录) 会议
Hong Kong, Hong kong,
作者:  He, Hongyu[1,2];  Deng, Wanling[3];  Liu, Yuan[4];  Lin, Xinnan[2];  Zheng, Xueren[5]
收藏  |  浏览/下载:3/0  |  提交时间:2019/04/11
Analysis of 1/f Noise for Polycrystalline Silicon TFTs Considering Mobility Power-Law Parameter (CPCI-S收录) 会议
作者:  He, Hongyu[1,2];  Liu, Yuan[3];  Wang, Hao[4];  Lin, Xinnan[2];  Zheng, Xueren[5]
收藏  |  浏览/下载:2/0  |  提交时间:2019/04/11
A simple leakage current model for polycrystalline silicon nanowire thin-film transistors (EI收录) 会议论文
2013 IEEE International Conference of Electron Devices and Solid-State Circuits, EDSSC 2013, Hong Kong, Hong kong, June 3, 2013 - June 5, 2013
作者:  He, Hongyu[1,2];  He, Jin[1,2];  Deng, Wanling[1,2];  Wang, Hao[1,2];  Hu, Yue[1,2]
收藏  |  浏览/下载:6/0  |  提交时间:2019/04/15
A Simple Leakage Current Model for Polycrystalline Silicon Nanowire Thin-Film Transistors (CPCI-S收录) 会议论文
2013 IEEE INTERNATIONAL CONFERENCE OF ELECTRON DEVICES AND SOLID-STATE CIRCUITS (EDSSC)
作者:  He, Hongyu[1,2];  He, Jin[1,2];  Deng, Wanling[1,2];  Wang, Hao[1,2];  Hu, Yue[1,2]
收藏  |  浏览/下载:1/0  |  提交时间:2019/04/15


©版权所有 ©2017 CSpace - Powered by CSpace