CORC

浏览/检索结果: 共13条,第1-10条 帮助

限定条件                
已选(0)清除 条数/页:   排序方式:
Characterization of Hafnium-Zirconium-Oxide-Nitride films grown by ion beam assisted deposition 期刊论文
VACUUM, 2012, 卷号: 86, 期号: 8, 页码: 1078-1082
Jin, CG; Yu, T; Bo, Y; Zhao, Y; Zhang, HY; Dong, YJ; Wu, XM; Zhuge, LJ; Ge, SB
收藏  |  浏览/下载:14/0  |  提交时间:2013/04/17
The structure and electrical properties of HfTaON high-k films prepared by DIBSD 期刊论文
APPLIED SURFACE SCIENCE, 2012, 卷号: 258, 期号: 7, 页码: 2953-2958
Yu, T; Jin, CG; Yang, XM; Dong, YJ; Zhang, HY; Zhuge, LJ; Wu, XM; Wu, ZF
收藏  |  浏览/下载:7/0  |  提交时间:2013/04/17
Characterization of Hafnium-Zirconium-Oxide-Nitride films grown by ion beam assisted deposition 期刊论文
VACUUM, 2012, 卷号: 86, 期号: 8, 页码: 1078-1082
Jin, CG; Yu, T; Bo, Y; Zhao, Y; Zhang, HY; Dong, YJ; Wu, XM; Zhuge, LJ; Ge, SB
收藏  |  浏览/下载:56/0  |  提交时间:2013/05/10
The structure and electrical properties of HfTaON high-k films prepared by DIBSD 期刊论文
APPLIED SURFACE SCIENCE, 2012, 卷号: 258, 期号: 7, 页码: 2953-2958
Yu, T; Jin, CG; Yang, XM; Dong, YJ; Zhang, HY; Zhuge, LJ; Wu, XM; Wu, ZF
收藏  |  浏览/下载:9/0  |  提交时间:2013/05/10
A comprehensive study of various etch processes for the removal of suicide-block-film in submicron CMOS technologies 期刊论文
MICROELECTRONIC ENGINEERING, 2011, 卷号: 88, 期号: 11, 页码: 3270-3274
Li, R; Wang, J; Sun, ZH; Dong, YQ; Kong, WR; Yu, LJ; He, J; (程新红); Wang, CD
收藏  |  浏览/下载:10/0  |  提交时间:2012/04/10
The transmission properties of pairing structure of negative permittivity and negative permeability materials 期刊论文
ACTA PHYSICA SINICA, 2007, 卷号: 56, 期号: 8, 页码: 4657-4660
Dong, LJ; Jiang, HT; Yang, CQ; Shi, YL
收藏  |  浏览/下载:12/0  |  提交时间:2012/03/24
Effect of STI-induced mechanical stress on leakage current in deep submicron CMOS devices 期刊论文
CHINESE PHYSICS, 2007, 卷号: 16, 期号: 10, 页码: 3104-3107
Li, R; Yu, LJ; Dong, YM; Wang, CD
收藏  |  浏览/下载:5/0  |  提交时间:2012/03/24
A comprehensive study of reducing the STI mechanical stress effect on channel-width-dependent I-dsat 期刊论文
SEMICONDUCTOR SCIENCE AND TECHNOLOGY, 2007, 卷号: 22, 期号: 12, 页码: 1292-1297
Li, R; Yu, LJ; Xin, HW; Dong, YM; Tao, K; Wang, CD
收藏  |  浏览/下载:9/0  |  提交时间:2012/03/24
Quantum confinement effect in SiO2 films containing Ge microcrystallites 期刊论文
JOURNAL OF MATERIALS SCIENCE, 2002, 卷号: 37, 期号: 11, 页码: 2259-2261
Tang, NY; Wu, XM; Zhuge, LJ; Ye, CN; Yao, WG; Chen, J; Dong, YM; Yu, YH
收藏  |  浏览/下载:9/0  |  提交时间:2012/03/24
Strong green electroluminescence from silicon based oxide films 期刊论文
SURFACE & COATINGS TECHNOLOGY, 2002, 卷号: 154, 期号: 1, 页码: 82-87
Wu, XM; Zhuge, LJ; Tang, NY; Ye, CN; Ning, ZY; Yao, WG; Dong, YM; Yu, YH
收藏  |  浏览/下载:14/0  |  提交时间:2012/03/24


©版权所有 ©2017 CSpace - Powered by CSpace