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Realizing high breakdown voltage for a novel interface charges islands structure based on partial-SOI substrate 期刊论文
2012, 卷号: 52, 页码: 692-697
作者:  Hu, Shengdong[1,2];  Luo, Jun[2];  Tan, Kaizhou[2];  Zhang, Ling[1];  Li, Zhaoji[3]
收藏  |  浏览/下载:2/0  |  提交时间:2019/11/28
A novel analytical model of the vertical breakdown voltage on impurity concentration in top silicon layer for SOI high voltage devices 期刊论文
2011, 卷号: 98, 页码: 973-980
作者:  Hu, Shengdong[1,2];  Zhang, Bo[2];  Li, Zhaoji[2]
收藏  |  浏览/下载:6/0  |  提交时间:2019/11/28
Complementary charge islands structure for a high voltage device of partial-SOI 期刊论文
2011, 卷号: 32
作者:  Wu, Lijuan[1,2];  Hu, Shengdong[1,3];  Zhang, Bo[1];  Li, Zhaoji[1]
收藏  |  浏览/下载:1/0  |  提交时间:2019/11/30


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