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New insights into the design for end-of-life variability of NBTI in scaled high-��/metal-gate Technology for the nano-reliability era 其他
2015-01-01
Ren, Pengpeng; Wang, Runsheng; Ji, Zhigang; Hao, Peng; Jiang, Xiaobo; Guo, Shaofeng; Luo, Mulong; Duan, Meng; Zhang, Jian F.; Wang, Jianping; Liu, Jinhua; Bu, Weihai; Wu, Jingang; Wong, Waisum; Yu, Shaofeng; Wu, Hanming; Lee, Shiuh-Wuu; Xu, Nuo; Huang, Ru
收藏  |  浏览/下载:6/0  |  提交时间:2017/12/03
New understanding of state-loss in complex RTN: Statistical experimental study, trap interaction models, and impact on circuits 其他
2015-01-01
Zou, Jibin; Wang, Runsheng; Guo, Shaofeng; Luo, Mulong; Yu, Zhuoqing; Jiang, Xiaobo; Ren, Pengpeng; Wang, Jianping; Liu, Jinhua; Wu, Jingang; Wong, Waisum; Yu, Shaofeng; Wu, Hanming; Lee, Shiuh-Wuu; Wang, Yangyuan; Huang, Ru
收藏  |  浏览/下载:5/0  |  提交时间:2017/12/03
ASI Regulations Comparison for GSO Satellite Communication System at Ku-band 其他
2015-01-01
Ma, Yuhong; Zhu, Jinhua; Luo, Wu
收藏  |  浏览/下载:5/0  |  提交时间:2017/12/03
ASI regulations comparison for GSO satellite communication system at Ku-band 其他
2015-01-01
Ma, Yuhong; Zhu, Jinhua; Luo, Wu
收藏  |  浏览/下载:2/0  |  提交时间:2017/12/03
New Observations on Complex RTN in Scaled High-kappa/Metal-gate MOSFETs - the Role of Defect Coupling under DC/AC Condition 其他
2013-01-01
Ren, Pengpeng; Hao, Peng; Liu, Changze; Wang, Runsheng; Jiang, Xiaobo; Qin, Yingxin; Huang, Ru; Guo, Shaofeng; Luo, Mulong; Zou, Jibin; Li, Meng; Wang, Jianping; Wu, Jingang; Liu, Jinhua; Bu, Weihai; Wong, Waisum; Yu, Scott; Wu, Hanming; Lee, Shiuh-Wuu; Wang, Yangyuan
收藏  |  浏览/下载:3/0  |  提交时间:2015/11/13
Deep understanding of AC RTN in MuGFETs through new characterization method and impacts on logic circuits 其他
2013-01-01
Zou, Jibin; Wang, Runsheng; Luo, Mulong; Huang, Ru; Xu, Nuo; Ren, Pengpeng; Liu, Changze; Xiong, Weize; Wang, Jianping; Liu, Jinhua; Wu, Jingang; Wong, Waisum; Yu, Shaofeng; Wu, Hanming; Lee, Shiuh-Wuu; Wang, Yangyuan
收藏  |  浏览/下载:5/0  |  提交时间:2015/11/13
New observations on complex RTN in scaled high-��/metal-gate MOSFETs - The role of defect coupling under DC/AC condition 其他
2013-01-01
Ren, Pengpeng; Hao, Peng; Liu, Changze; Wang, Runsheng; Jiang, Xiaobo; Qiu, Yingxin; Huang, Ru; Guo, Shaofeng; Luo, Mulong; Zou, Jibin; Li, Meng; Wang, Jianping; Wu, Jingang; Liu, Jinhua; Bu, Weihai; Wong, Waisum; Yu, Scott; Wu, Hanming; Lee, Shiuh-Wuu; Wang, Yangyuan
收藏  |  浏览/下载:2/0  |  提交时间:2015/11/13


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