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浏览/检索结果: 共4条，第1-4条 帮助 限定条件 内容类型：期刊论文    专题：北京大学    第一署名单位    第一作者单位    通讯作者单位     已选(0)清除 条数/页：5101520253035404550556065707580859095100   排序方式：请选择作者升序作者降序题名升序题名降序发表日期升序发表日期降序提交时间升序提交时间降序 Impact of quantum confinement on transport and the electrostatic driven performance of silicon nanowire transistors at the scaling limit 期刊论文 SOLID-STATE ELECTRONICS, 2017 Al-Ameri, Talib; Georgiev, Vihar P.; Sadi, Toufik; Wang, Yijiao; Adamu-Lema, Fikru; Wang, Xingsheng; Amoroso, Salvatore M.; Towie, Ewan; Brown, Andrew; Asenov, Asen 收藏  |  浏览/下载：4/0  |  提交时间：2017/12/03 CMOS  Electrostatics  Nanowire transistors  Performance  Quantum effects  TCAD  GATE  SIMULATION  INVERSION  MULTIGATE  MOSFETS  NM   A Device-Level Characterization Approach to Quantify the Impacts of Different Random Variation Sources in FinFET Technology 期刊论文 IEEE ELECTRON DEVICE LETTERS, 2016 Jiang, Xiaobo; Guo, Shaofeng; Wang, Runsheng; Wang, Xingsheng; Cheng, Binjie; Asenov, Asen; Huang, Ru 收藏  |  浏览/下载：3/0  |  提交时间：2017/12/04 FinFET  random variation  characterization  line-edge roughness (LER)  metal gate granularity (MGG)  LINE-EDGE ROUGHNESS  VARIABILITY  LWR  LER   Simulation Study of the Impact of Quantum Confinement on the Electrostatically Driven Performance of n-type Nanowire Transistors 期刊论文 IEEE TRANSACTIONS ON ELECTRON DEVICES, 2015 Wang, Yijiao; Al-Ameri, Talib; Wang, Xingsheng; Georgiev, Vihar P.; Towie, Ewan; Amoroso, Salvatore Maria; Brown, Andrew R.; Cheng, Binjie; Reid, David; Riddet, Craig; Shifren, Lucian; Sinha, Saurabh; Yeric, Greg; Aitken, Robert; Liu, Xiaoyan; Kang, Jinfeng; Asenov, Asen 收藏  |  浏览/下载：4/0  |  提交时间：2017/12/03 CMOS  electrostatics  nanowire transistors (NWs)  performance  quantum effects  TCAD  STATISTICAL VARIABILITY  INVERSION-LAYERS  GATE  CMOS  GENERATION  ELECTRON  DENSITY  FINFETS  DEVICES  MOSFETS   New Assessment Methodology Based on Energy-Delay-Yield Cooptimization for Nanoscale CMOS Technology 期刊论文 IEEE TRANSACTIONS ON ELECTRON DEVICES, 2015 Jiang, Xiaobo; Wang, Junyao; Wang, Xingsheng; Wang, Runsheng; Cheng, Binjie; Asenov, Asen; Wei, Lan; Huang, Ru 收藏  |  浏览/下载：2/0  |  提交时间：2017/12/03 Delay  energy  optimization  reliability  variability  yield  LINEWIDTH ROUGHNESS LWR  VARIABILITY  DEVICES  REQUIREMENTS  OPTIMIZATION  PERFORMANCE  LER  NM