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Scalability and reliability of TaN/HfN/HfO(2) gate stacks fabricated by a high temperature process 其他
2005-01-01
Kang, JF; Yu, HY; Ren, C; Yang, H; Sa, N; Liu, XY; Han, RQ; Li, MF; Chan, DSH; Kwong, DL
收藏  |  浏览/下载:2/0  |  提交时间:2015/11/13
Scaling properties of GOI MOSFETs in naon scale by full band Monte Carlo simulation 其他
2004-01-01
Liu, XY; Du, G; Xia, ZL; Kang, JF; Wang, Y; Han, RQ; Yu, HY; Li, MF; Kwong, DL
收藏  |  浏览/下载:1/0  |  提交时间:2015/11/13
Charactcristics of sub-1 nm CVID HfO2 gate dielectrics with HfN electrodcs for advanccd CMOS applications 其他
2004-01-01
Kang, JF; Yu, HY; Ren, C; Wang, XP; Li, MF; Chan, DSH; Liu, XY; Han, RQ; Wang, YY; Kwong, DL
收藏  |  浏览/下载:2/0  |  提交时间:2015/11/13
TDDB characteristics of ultra-thin HfN/HfO2 gate stack 其他
2004-01-01
Yang, H; Sa, N; Tang, L; Liu, XY; Kang, JF; Han, RQ; Yu, HY; Ren, C; Li, MF; Chan, DSH; Kwong, DL
收藏  |  浏览/下载:2/0  |  提交时间:2015/11/13
HUBER OPTIMIZATION OF CIRCUITS - A ROBUST APPROACH 其他
1993-01-01
BANDLER, JW; CHEN, SH; BIERNACKI, RM; GAO, L; MADSEN, K; YU, HY
收藏  |  浏览/下载:2/0  |  提交时间:2015/11/12


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