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浏览/检索结果: 共6条，第1-6条 帮助 限定条件 内容类型：其他     已选(0)清除 条数/页：5101520253035404550556065707580859095100   排序方式：请选择作者升序作者降序题名升序题名降序发表日期升序发表日期降序提交时间升序提交时间降序 New Insights into Oxide Traps Characterization in Gate-All-Around Nanowire Transistors with TiN Metal Gates Based on Combined I(g)-I(d) RTS Technique 其他 2009-01-01 Zhang, Liangliang; Zhuge, Jing; Wang, Runsheng; Huang, Ru; Liu, Changze; Wu, Dake; Kang, Zhaoyi; Kim, Done-Won; Park, Donggun; Wang, Yangyuan 收藏  |  浏览/下载：4/0  |  提交时间：2015/11/13 RANDOM TELEGRAPH SIGNALS  NOISE  MOSFETS  FLUCTUATIONS  CARRIER   New insights into oxide traps characterization in gate-all-around nanowire transistors with TiN metal gates based on combined Ig-Id RTS technique 其他 2009-01-01 Zhang, Liangliang; Zhuge, Jing; Wang, Runsheng; Huang, Ru; Liu, Changze; Wu, Dake; Kang, Zhaoyi; Kim, Dong-Won; Park, Donggun; Wang, Yangyuan 收藏  |  浏览/下载：5/0  |  提交时间：2015/11/13 An Experimental Study on Carrier Transport in Silicon Nanowire Transistors: How Close to the Ballistic Limit? 其他 2008-01-01 Wang, Runsheng; Jing Zhuge; Huang, Ru; Zhang, Liangliang; Kim, Dong-Won; Zhang, Xing; Park, Donggun; Wang, Yangyuan 收藏  |  浏览/下载：3/0  |  提交时间：2015/11/10 Impacts of Non-negligible Electron Trapping/Detrapping on the NBTI Characteristics in Silicon Nanowire Transistors with TiN Metal Gates 其他 2008-01-01 Zhang, Liangliang; Wang, Runsheng; Zhuge, Jing; Huang, Ru; Kim, Dong-Won; Park, Donggun; Wang, Yangyuan 收藏  |  浏览/下载：2/0  |  提交时间：2015/11/10 GENERATION  CARRIER  SILC   Investigation of analog/RF performance and reliability behavior of silicon nanowire MOSFETs (invited) 其他 2007-01-01 Huang, Ru; Wang, Runsheng; Zhuge, Jing; Tian, Yu; Wang, Zhenhua; Kim, Dong-Won; Park, Donggun; Wang, Yangyuan 收藏  |  浏览/下载：5/0  |  提交时间：2015/11/10 TRANSISTORS   New observations on the hot carrier and NBTI reliability of silicon nanowire transistors 其他 2007-01-01 Wang, Runsheng; Huang, Ru; Kim, Dong-Won; He, Yandong; Wang, Zhenhua; Jia, Gaosheng; Park, Donggun; Wang, Yangyuan 收藏  |  浏览/下载：4/0  |  提交时间：2015/11/10