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Dynamic NBTI characteristics of p-MOSFET with N-plasma SiON gate dielectric 其他
2007-01-01
Yan, B.G.; Kang, J.F.; Sa, N.; Liu, X.Y.; Du, G.; Han, R.Q.; Liao, C.C.; Gan, Z.H.; Liao, M.; Wang, J.P.; Wong, W.
收藏  |  浏览/下载:3/0  |  提交时间:2015/11/10
Scalability and reliability of TaN/HfN/HfO(2) gate stacks fabricated by a high temperature process 其他
2005-01-01
Kang, JF; Yu, HY; Ren, C; Yang, H; Sa, N; Liu, XY; Han, RQ; Li, MF; Chan, DSH; Kwong, DL
收藏  |  浏览/下载:2/0  |  提交时间:2015/11/13
TDDB characteristics of ultra-thin HfN/HfO2 gate stack 其他
2004-01-01
Yang, H; Sa, N; Tang, L; Liu, XY; Kang, JF; Han, RQ; Yu, HY; Ren, C; Li, MF; Chan, DSH; Kwong, DL
收藏  |  浏览/下载:2/0  |  提交时间:2015/11/13
TDDB characteristics of ultra-thin HfN/HfO2 gate stack 其他
2004-01-01
Yang, Hong; Sa, Ning; Tang, Liang; Liu, Xiaoyan; Kang, Jinfeng; Han, Ruqi; Yu, H.Y.; Ren, C.; Li, M.-F.; Chan, D.S.H.; Kwong, D.-L.
收藏  |  浏览/下载:3/0  |  提交时间:2015/11/13


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