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CORC

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Minimal invasive microscopic tooth preparation in esthetic restoration: a specialist consensus 其他
2019-01-01
作者:  Yu, Haiyang;  Zhao, Yuwei;  Li, Junying;  Luo, Tian;  Gao, Jing
收藏  |  浏览/下载：57/0  |  提交时间：2019/12/05
MEASUREMENT CRUSTAL MOVEMENT ALONG ALTYN TAGH FAULT BY USING MULTIMODE INSAR TIME SERIES ANALYSIS 其他
2016-01-01
Zeng, Qiming; Jiao, Jian; Shen, Lin; Gao, Sheng; Fan, Ruiyan; Huang, Junsong; Shan, Xinjian
收藏  |  浏览/下载：6/0  |  提交时间：2017/12/03
Age and distribution of the Late Devonian brachiopod genus Dzieduszyckia Siemiradzki, 1909 in southern China 其他
2016-01-01
Nie, Ting; Guo, Wen; Sun, Yuan-Lin; Shen, Bing; Yin, Bao-An; Tang, Zhuan-Hong; Li, Yu-Kun; Huang, Xiang-Lin; Mai, Chi
收藏  |  浏览/下载：5/0  |  提交时间：2017/12/03
Optimal regularity of minimal graphs in the hyperbolic space 其他
2016-01-01
Han, Qing; Shen, Weiming; Wang, Yue
收藏  |  浏览/下载：5/0  |  提交时间：2017/12/03
Relay Backpropagation for Effective Learning of Deep Convolutional Neural Networks 其他
2016-01-01
Shen, Li; Lin, Zhouchen; Huang, Qingming
收藏  |  浏览/下载：4/0  |  提交时间：2017/12/03
ESD Reliability Improvement of the 0.25-mu m 60-V Power nLDMOS with Discrete Embedded SCRs Separated by STI Structures 其他
2016-01-01
Chen, Shen-Li; Wu, Yi-Cih; Lin, Jia-Ming; Yang, Chih-Hung; Yen, Chih-Ying; Chen, Kuei-Jyun; Chen, Hung-Wei
收藏  |  浏览/下载：4/0  |  提交时间：2017/12/03
ESD Reliability Evaluations of the 60-V nLDMOS by the Drain-side Discrete SCRs 其他
2016-01-01
Chen, Shen-Li; Chen, Kuei-Jyun; Wu, Yi-Cih; Lin, Jia-Ming; Yang, Chih-Hung; Yen, Chih-Ying
收藏  |  浏览/下载：4/0  |  提交时间：2017/12/03
LDMOS  
Design on ESD Robustness of Source-side Discrete Distribution in the 60-V High-Voltage nLDMOS Devices 其他
2016-01-01
Chen, Shen-Li; Yang, Chih-Hung; Yen, Chih-Ying; Chen, Kuei-Jyun; Wu, Yi-Cih; Lin, Jia-Ming
收藏  |  浏览/下载：3/0  |  提交时间：2017/12/03
LDMOS  
ESD reliability improvement of the 0.25-��m 60-V power nLDMOS with discrete embedded SCRs separated by STI structures 其他
2016-01-01
Chen, Shen-Li; Wu, Yi-Cih; Lin, Jia-Ming; Yang, Chih-Hung; Yen, Chih-Ying; Chen, Kuei-Jyun; Chen, Hung-Wei
收藏  |  浏览/下载：6/0  |  提交时间：2017/12/03
ESD-reliability characterizations of a 45-V p-channel LDMOS-SCR with the discrete-cathode end 其他
2016-01-01
Chen, Shen-Li; Huang, Yu-Ting; Wu, Yi-Cih; Lin, Jia-Ming; Yang, Chih-Hung; Yen, Chih-Ying; Chen, Kuei-Jyun
收藏  |  浏览/下载：4/0  |  提交时间：2017/12/03

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