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Atomic force microscopy and X-ray photoelectron spectroscopy study on the surface and interface states of Liq and ITO films 会议论文
2010 International Conference on Advances in Materials and Manufacturing Processes, ICAMMP 2010, Shenzhen, China, November 6, 2010 - November 8, 2010
作者:  Li, Jianfeng;  Song, Qing;  Shi, Weibing;  Zhang, Fujia
收藏  |  浏览/下载:3/0  |  提交时间:2017/01/20
Atomic spectroscopy  Absorption  Absorption spectroscopy  Argon  Atomic force microscopy  Binding energy  Electron energy levels  Electrons  Indium  ITO glass  Materials  O rings  Oxygen  Photoelectricity  Photons  Spectrum analysis  Sputtering  Surface morphology  Surfaces  Tin  X ray photoelectron spectroscopy  X rays  AFM observation  Air molecules  Argon ion  Blue electroluminescent materials  C atoms  Coated glass  Coordination bonds  Different sizes  Effect of oxygen  Indium tin oxide  ITO films  Li atoms  Liq/ITO  Organic light-emitting devices  Organic materials  Quinolate  Sputtering time  Surface and interface electron state  Surface and interface state  X-ray photoelectron spectroscopy studies  XPS  XPS spectra  


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