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Ring Artifacts Reduction in Cone-Beam CT Images based on Independent Component Analysis 会议论文
26th IEEE International Instrumentation and Measurement Technology Conference, Singapore, SINGAPORE, MAY 05-07, 2009
作者:  Chen, Yen-Wei*;  Duan, Guifang;  Fujita, Akinori;  Hirooka, Ken;  Ueno, Yoshihiro
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