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Low Temperature Solid-State-Diffusion Bonding for Fine-Pitch Cu/Sn/Cu Interconnect 会议论文
IEEE 65th Electronic Components and Technology Conference (ECTC), San Diego, CA, 2015-05-26
作者:  Cai, Jian;  Wang, Junqiang;  Wang, Qian;  Liu, Ziyu;  Wang, Dejun
收藏  |  浏览/下载:2/0  |  提交时间:2019/12/09
Copper Filling Process for Small Diameter, High Aspect Ratio Through Silicon Via (TSV) 会议论文
13th International Conference on Electronic Packaging Technology and High Density Packaging (ICEPT-HDP), Guilin, PEOPLES R CHINA, 2012-08-13
作者:  Wei, Tiwei;  Cai, Jian;  Wang, Qian;  Liu, Ziyu;  Li, Yinan
收藏  |  浏览/下载:7/0  |  提交时间:2019/12/13
A 3D Integration Testing Vehicle with TSV Interconnects 会议论文
14th International Conference on Electronic Materials and Packaging (EMAP), Hong Kong, PEOPLES R CHINA, 2012-12-13
作者:  Wei, Tiwei;  Wang, Qian;  Liu, Ziyu;  Li, Yinan;  Wang, Dejun
收藏  |  浏览/下载:3/0  |  提交时间:2019/12/13


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