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Impact of back-gate bias on the hysteresis effect in partially depleted SOI MOSFETs 期刊论文
CHINESE PHYSICS B, 2012, 卷号: 21, 期号: 5, 页码: 56602
Luo, JX; Chen, J; Zhou, JH; Wu, QQ; Chai, Z; Yu, T; Wang, X
收藏  |  浏览/下载:18/0  |  提交时间:2013/04/17
Impact of back-gate bias on the hysteresis effect in partially depleted SOI MOSFETs 期刊论文
CHINESE PHYSICS B, 2012, 卷号: 21, 期号: 5, 页码: 56602
Luo, JX; Chen, J; Zhou, JH; Wu, QQ; Chai, Z; Yu, T; Wang, X(重点实验室)
收藏  |  浏览/下载:13/0  |  提交时间:2013/05/10


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