CORC

浏览/检索结果: 共2条,第1-2条 帮助

限定条件    
已选(0)清除 条数/页:   排序方式:
Defect appearance on 4H-SiC homoepitaxial layers via molten KOH etching 期刊论文
JOURNAL OF CRYSTAL GROWTH, 2020, 卷号: 531, 页码: 125359
作者:  X.F. Liu;   G.G. Yan;   L. Sang;   Y.X. Niu;   Y.W. He;   Z.W. Shen;   Z.X. Wen;   J. Chen;   W.S. Zhao;   L. Wang;   M. Guan;   F. Zhang;   G.S. Sun;   Y.P. Zeng
收藏  |  浏览/下载:11/0  |  提交时间:2021/11/26
Effect of C/Si ratio on growth of 4H-SiC epitaxial layers on on-axis and 4° off-axis substrates 期刊论文
JOURNAL OF CRYSTAL GROWTH, 2020, 卷号: 531, 页码: 125362
作者:  G.G. Yan;   Y.W. He;   Z.W. Shen;   Y.X. Cui;   J.T. Li;   W.S. Zhao;   L. Wang;   X.F. Liu;   F. Zhang;   G.S. Sun;   Y.P. Zeng
收藏  |  浏览/下载:9/0  |  提交时间:2021/11/26


©版权所有 ©2017 CSpace - Powered by CSpace