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Defect Self-Compensation for High-Mobility Bilayer InGaZnO/In2O3 Thin-Film Transistor 期刊论文
ADVANCED ELECTRONIC MATERIALS, 2019, 卷号: 5, 期号: 6
作者:  He, Jiawei;  Li, Guoli;  Lv, Yawei;  Wang, Chunlan;  Liu, Chuansheng
收藏  |  浏览/下载:28/0  |  提交时间:2019/12/05
Exploring and suppressing the kink effect of black phosphorus field-effect transistors operating in the saturation regime 期刊论文
NANOSCALE, 2019, 卷号: 11, 期号: 21
作者:  Xia, Ying;  Li, Guoli;  Jiang, Bei;  Yang, Zhenyu;  Liu, Xingqiang
收藏  |  浏览/下载:15/0  |  提交时间:2019/12/05
Exploring and suppressing the kink effect of black phosphorus field-effect transistors operating in the saturation regime 期刊论文
Nanoscale, 2019, 卷号: 11, 期号: 21
作者:  Xia, Ying;  Li, Guoli;  Jiang, Bei;  Yang, Zhenyu;  Liu, Xingqiang
收藏  |  浏览/下载:4/0  |  提交时间:2019/12/05
Defect Self-Compensation for High-Mobility Bilayer InGaZnO/In2O3 Thin-Film Transistor 期刊论文
Advanced Electronic Materials, 2019, 卷号: 5, 期号: 6
作者:  He, Jiawei;  Li, Guoli;  Lv, Yawei;  Wang, Chunlan;  Liu, Chuansheng
收藏  |  浏览/下载:14/0  |  提交时间:2019/12/05


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