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半导体器件制造方法 专利
专利号: CN201210475097.2, 申请日期: 2017-11-21, 公开日期: 2014-06-04
作者:  崔虎山;  钟汇才;  项金娟;  赵超
收藏  |  浏览/下载:14/0  |  提交时间:2018/04/25
Mobility Degradation by Remote Coulomb Scattering and Distribution of Charge and Dipole in Al2O3/GeOx Gate Stacks of Ge Based MOSFET 会议论文
作者:  Xiang JJ(项金娟);  Zhou LX(周丽星);  Wang XL(王晓磊);  Zhao C(赵超);  Ye TC(叶甜春)
收藏  |  浏览/下载:14/0  |  提交时间:2018/07/26
Effects of Annealing Ambient on Interface Charge and Dipole in GeOx/Al2O3 Gate Stacks of Ge Based MOSCAP 会议论文
作者:  Wang XL(王晓磊);  Xiang JJ(项金娟);  Zhao C(赵超);  Wang WW(王文武);  Ye TC(叶甜春)
收藏  |  浏览/下载:14/0  |  提交时间:2018/07/26
Fabrication and Characterization of p-Channel Charge Trapping Type FOI-FinFET Memory with MAHAS Structure 期刊论文
ECS Journal of Solid State Science and Technology, 2017
作者:  Gu J(顾杰);  Hou CZ(侯朝昭);  Zhang QZ(张青竹);  Yin HX(殷华湘);  Xiang JJ(项金娟)
收藏  |  浏览/下载:14/0  |  提交时间:2018/07/05
The Challenges of Advanced CMOS Process from 2D to 3D 期刊论文
Applied Sciences, 2017
作者:  Wang GL(王桂磊);  Gu SH(顾世海);  Liu JB(刘金彪);  Xiang JJ(项金娟);  Li JJ(李俊杰)
收藏  |  浏览/下载:10/0  |  提交时间:2018/07/05
用于薄膜沉积的铝前驱体及其制备方法 专利
专利号: CN201410532553.1, 申请日期: 2017-09-15, 公开日期: 2016-04-20
作者:  项金娟;  王大伟;  苗红艳;  杨淑艳;  许从应
收藏  |  浏览/下载:23/0  |  提交时间:2018/04/24
Improved Operation Characteristics for Nonvolatile Charge-Trapping Memory Capacitors with High-Dielectrics and SiGe Epitaxial Substrates 期刊论文
CHINESE PHYSICS LETTERS, 2017
作者:  Zhang QZ(张青竹);  Wu ZH(吴振华);  Yin HX(殷华湘);  Wang GL(王桂磊);  Hou CZ(侯朝昭)
收藏  |  浏览/下载:13/0  |  提交时间:2018/07/05
Hole mobility degradation by remote Coulomb scattering and charge distribution in Al2O3/GeOx gate stacks in bulk Ge pMOSFET with GeOx grown by ozone oxidation 期刊论文
JOURNAL OF PHYSICS D-APPLIED PHYSICS, 2017
作者:  Ye TC(叶甜春);  Zhou LX(周丽星);  Wang XL(王晓磊);  Ma XL(马雪丽);  Xiang JJ(项金娟)
收藏  |  浏览/下载:7/0  |  提交时间:2018/07/09
Physically Based Evaluation of Effect of Buried Oxide on Surface Roughness Scattering Limited Hole Mobility in Ultrathin GeOI MOSFET 期刊论文
IEEE Transactrions on Elelctron Diveces, 2017
作者:  Wang SK(王盛凯);  Han K(韩楷);  Wang WW(王文武);  Ye TC(叶甜春);  Zhao C(赵超)
收藏  |  浏览/下载:15/0  |  提交时间:2018/07/09
Hot Implantations of P into Ge: Impact on the Diffusion Profile 期刊论文
ECS Journal of Solid State Science and Technology, 2017
作者:  Xiang JJ(项金娟);  Eddy Simoen;  Luo J(罗军);  Liu JB(刘金彪);  Ye TC(叶甜春)
收藏  |  浏览/下载:14/0  |  提交时间:2018/06/08


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