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Mechanical and thermal characterization of a novel nanocomposite thermal interface material for electronic packaging 期刊论文
MICROELECTRONICS RELIABILITY, 2016, 卷号: 56, 页码: 129-135
作者:  Sun, Shuangxi[1];  Chen, Si[2];  Luo, Xin[3];  Fu, Yifeng[4];  Ye, Lilei[5]
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