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Enlage the process window of patterns in 22nm node by using mask topography aware OPC and SMO 期刊论文
CSTIC, 2015
作者:  Song ZY(宋之洋);  Wei YY(韦亚一);  Su YJ(粟雅娟);  Guo MR(郭沫然);  Dong LS(董立松)
收藏  |  浏览/下载:9/0  |  提交时间:2016/05/31
Thickness optimization for lithography process on different silicon substrate 期刊论文
Proc. of SPIE, 2015
作者:  Su XJ(苏晓菁);  Su YJ(粟雅娟);  Liu YS(刘艳松);  Wei YY(韦亚一)
收藏  |  浏览/下载:12/0  |  提交时间:2016/05/31
Focus Shift Impacted by Mask 3D And Comparison between Att. PSM and OMOG 期刊论文
Proc. of SPIE, 2015
作者:  Dong LS(董立松);  Liu YS(刘艳松);  Su XJ(苏晓菁);  Song ZY(宋之洋);  Wei YY(韦亚一)
收藏  |  浏览/下载:15/0  |  提交时间:2016/05/31


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