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浏览/检索结果: 共8条，第1-8条 帮助 限定条件 发表日期：2015    专题：北京大学    第一署名单位    第一作者单位    通讯作者单位     已选(0)清除 条数/页：5101520253035404550556065707580859095100   排序方式：请选择作者升序作者降序题名升序题名降序发表日期升序发表日期降序提交时间升序提交时间降序 Usp16 regulates kinetochore localization of Plk1 to promote proper chromosome alignment in mitosis 期刊论文 JOURNAL OF CELL BIOLOGY, 2015 Zhuo, Xiaolong; Guo, Xiao; Zhang, Xiaoyan; Jing, Guihua; Wang, Yao; Chen, Qiang; Jiang, Qing; Liu, Junjun; Zhang, Chuanmao 收藏  |  浏览/下载：38/0  |  提交时间：2017/12/03 SPINDLE ASSEMBLY CHECKPOINT  CELL-CYCLE PROGRESSION  POLO-LIKE KINASES  MICROTUBULE ATTACHMENTS  PLK1-PBIP1 INTERACTION  PHOSPHORYLATION  POLO-LIKE-KINASE-1  DYNAMICS  PROTEIN  BUBR1   Finding a suitable separation condition for TLC/FTIR analysis by using multiple-narrow-band TLC technique 期刊论文 rsc advances, 2015 Jiang, Ye; Kang, Xiaoyan; Gao, Danqing; He, Anqi; Guo, Ran; Fan, Xiaokun; Zhai, Yanjun; Xia, Jinming; Xu, Yizhuang; Noda, Isao; Wu, Jinguang 收藏  |  浏览/下载：5/0  |  提交时间：2015/11/10 THIN-LAYER-CHROMATOGRAPHY  INFRARED PHOTOACOUSTIC-SPECTROSCOPY  FOURIER-TRANSFORM SPECTROMETRY  FLUORIDE FINE PARTICLES  STATIONARY-PHASE  PLANAR CHROMATOGRAPHY   Comprehensive Understanding of Hot Carrier Degradation in Multiple-fin SOI FinFETs 其他 2015-01-01 Jiang, Hai; Yin, Longxiang; Li, Yun; Xu, Nuo; Zhao, Kai; He, Yandong; Du, Gang; Liu, Xiaoyan; Zhang, Xing 收藏  |  浏览/下载：5/0  |  提交时间：2017/12/03 multi-gate FET  Silicon-on-Insulator  hot carrier  interface charge  oxide charge  reliability  REGIME   Simulation of Positive Bias Temperature Instability (PBTI) in high-k FinFET by KMC method 其他 2015-01-01 Li, Yun; Wang, Yijiao; Jiang, Hai; Du, Gang; Kang, Jinfeng; Liu, Xiaoyan 收藏  |  浏览/下载：3/0  |  提交时间：2017/12/03 3-D Resistive Memory Arrays: From Intrinsic Switching Behaviors to Optimization Guidelines 期刊论文 IEEE TRANSACTIONS ON ELECTRON DEVICES, 2015 Li, Haitong; Gao, Bin; Chen, Hong-Yu; Chen, Zhe; Huang, Peng; Liu, Rui; Zhao, Liang; Jiang, Zizhen; Liu, Lifeng; Liu, Xiaoyan; Yu, Shimeng; Kang, Jinfeng; Nishi, Yoshi; Wong, H.S. Philip 收藏  |  浏览/下载：3/0  |  提交时间：2017/12/03 3-D array  optimization  reliability  resistive random access memory (RRAM)  variability  RANDOM-ACCESS MEMORY  METAL-OXIDE RRAM  DEVICES  MODEL  SIMULATION   Investigation of Self-Heating Effect on Hot Carrier Degradation in Multiple-Fin SOI FinFETs 期刊论文 IEEE ELECTRON DEVICE LETTERS, 2015 Jiang, Hai; Liu, Xiaoyan; Xu, Nuo; He, Yandong; Du, Gang; Zhang, Xing 收藏  |  浏览/下载：3/0  |  提交时间：2017/12/03 FinFETs  hot carrier degradation (HCD)  reliability  self-heating effect (SHE)  silicon-on-insulator (SOI)  thermal resistance (Rth)  N-FINFETS  MOSFETS  INJECTION   3D KMC reliability simulation of nano-scaled HKMG nMOSFETs with multiple traps coupling 其他 2015-01-01 Li, Yun; Lun, Zhiyuan; Huang, Peng; Wang, Yijiao; Jiang, Hai; Du, Gang; Liu, Xiaoyan 收藏  |  浏览/下载：8/0  |  提交时间：2017/12/03 3D KMC Reliability Simulation of Nano-Scaled HKMG nMOSFETs with Multiple Traps Coupling 其他 2015-01-01 Li, Yun; Lun, Zhiyuan; Huang, Peng; Wang, Yijiao; Jiang, Hai; Du, Gang; Liu, Xiaoyan 收藏  |  浏览/下载：3/0  |  提交时间：2017/12/03 HKMG  nMOSFETs  3D  kinetic Monte-Carlo  multiple traps  coupling  trap generation/recombination  capture time  emission time  threshold voltage shift  trapping  detrapping  PBTI