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CORC

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Improvement of two-way continuous-variable quantum key distribution with virtual photon subtraction 期刊论文
QUANTUM INFORMATION PROCESSING, 2017
Zhao, Yijia; Zhang, Yichen; Li, Zhengyu; Yu, Song; Guo, Hong
收藏  |  浏览/下载：3/0  |  提交时间：2017/12/03
Dynamic Correlations between Intrinsic Connectivity and Extrinsic Connectivity of the Auditory Cortex in Humans 期刊论文
FRONTIERS IN HUMAN NEUROSCIENCE, 2017
Cui, Zhuang; Wang, Qian; Gao, Yayue; Wang, Jing; Wang, Mengyang; Teng, Pengfei; Guan, Yuguang; Zhou, Jian; Li, Tianfu; Luan, Guoming; Li, Liang
收藏  |  浏览/下载：4/0  |  提交时间：2017/12/03
ANOMALY IDENTIFICATION FROM SUPER-LOW FREQUENCY ELECTROMAGNETIC DATA FOR THE COALBED METHANE DETECTION 其他
2016-01-01
Zhao, S. S.; Wang, N.; Hui, J.; Ye, X.; Qin, Q.
收藏  |  浏览/下载：5/0  |  提交时间：2017/12/03
Robust kernel estimation with outliers handling for image deblurring 其他
2016-01-01
Pan, Jinshan; Lin, Zhouchen; Su, Zhixun; Yang, Ming-Hsuan
收藏  |  浏览/下载：3/0  |  提交时间：2017/12/03
Non-Gaussian postselection and virtual photon subtraction in continuous-variable quantum key distribution 期刊论文
PHYSICAL REVIEW A, 2016
Li, Zhengyu; Zhang, Yichen; Wang, Xiangyu; Xu, Bingjie; Peng, Xiang; Guo, Hong
收藏  |  浏览/下载：1/0  |  提交时间：2017/12/03
Image Denoising via Bandwise Adaptive Modeling and Regularization Exploiting Nonlocal Similarity 期刊论文
IEEE TRANSACTIONS ON IMAGE PROCESSING, 2016
Xiong, Ruiqin; Liu, Hangfan; Zhang, Xinfeng; Zhang, Jian; Ma, Siwei; Wu, Feng; Gao, Wen
收藏  |  浏览/下载：7/0  |  提交时间：2017/12/03
Robust Kernel Estimation with Outliers Handling for Image Deblurring 其他
2016-01-01
Pan, Jinshan; Lin, Zhouchen; Su, Zhixun; Yang, Ming-Hsuan
收藏  |  浏览/下载：7/0  |  提交时间：2017/12/03
Magnetic Anomaly Detection for Simultaneous Moving Target and Magnetometer 其他
2014-01-01
Zhang, Hao; Xia, Ming-Yao
收藏  |  浏览/下载：7/0  |  提交时间：2017/12/03
Marcus canonical integral for non-Gaussian processes and its computation: Pathwise simulation and tau-leaping algorithm 其他
2013-01-01
Li, Tiejun; Min, Bin; Wang, Zhiming
收藏  |  浏览/下载：4/0  |  提交时间：2015/11/10
Investigations on Line-Edge Roughness (LER) and Line-Width Roughness (LWR) in Nanoscale CMOS Technology: Part II-Experimental Results and Impacts on Device Variability 期刊论文
ieee电子器件汇刊, 2013
Wang, Runsheng; Jiang, Xiaobo; Yu, Tao; Fan, Jiewen; Chen, Jiang; Pan, David Z.; Huang, Ru
收藏  |  浏览/下载：7/0  |  提交时间：2015/11/10

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