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Air-and Active Hydrogen-Induced Electron Trapping and Operational Instability in n-Type Polymer Field-Effect Transistors 期刊论文
ADVANCED FUNCTIONAL MATERIALS, 2017
Un, Hio-Ieng; Zheng, Yu-Qing; Shi, Ke; Wang, Jie-Yu; Pei, Jian
收藏  |  浏览/下载：2/0  |  提交时间：2017/12/03
Evaulation the Degradation in nMOSFETs with HfO2 Gate Dielectric and Interfacial Layer by 3D Kinetic Monte-Carlo Method 其他
2016-01-01
Li, Yun; Lun, Zhiyuan; Wang, Yijiao; Huang, Peng; Jiang, Hai; Zhang, Xing; Du, Gang; Liu, Xiaoyan
收藏  |  浏览/下载：2/0  |  提交时间：2017/12/03
Scale-to-scale energy transfer in mixing flow induced by the Richtmyer-Meshkov instability 期刊论文
PHYSICAL REVIEW E, 2016
Liu, Han; Xiao, Zuoli
收藏  |  浏览/下载：5/0  |  提交时间：2017/12/03
Ab initio determination of the instability growth rate of warm dense beryllium-deuterium interface 期刊论文
PHYSICS OF PLASMAS, 2015
Wang, Cong; Li, Zi; Li, DaFang; Zhang, Ping
收藏  |  浏览/下载：3/0  |  提交时间：2017/12/03
An SPH model for multiphase flows with complex interfaces and large density differences 期刊论文
计算物理学杂志, 2015
Chen, Z.; Zong, Z.; Liu, M. B.; Zou, L.; Li, H. T.; Shu, C.
收藏  |  浏览/下载：3/0  |  提交时间：2015/11/11
A New Model for Two-Dimensional Electrical-Field-Dependent V-th Instability of pMOSFETs With Ultrathin DPN Gate Dielectrics 期刊论文
ieee electron device letters, 2011
Yang, Jiaqi; Yang, Jingfeng; Liu, X. Y.; Han, R. Q.; Kang, J. F.; Gan, Z. H.; Liao, C. C.; Wu, H. M.
收藏  |  浏览/下载：6/0  |  提交时间：2015/11/10
Drain bias effect on the interface traps of pMOSFETs under negative bias temperature stress 其他
2009-01-01
Pan, J.Y.; Yang, J.Q.; Qiao, Y.; Liu, X.Y.; Han, R.Q.; Kang, J.F.; Liao, C.C.; Wu, H.M.; Wu, Y.J.
收藏  |  浏览/下载：4/0  |  提交时间：2015/11/13
Anomalous negative bias temperature instability degradation induced by source/drain bias in nanoscale PMOS devices 期刊论文
ieee 纳米技术汇刊, 2008
Yan, Baoguang; Yang, Jingfeng; Xia, Zhiliang; Liu, Xiaoyan; Du, Gang; Han, Ruqi; Kang, Jinfeng; Liao, C. C.; Gan, Zhenghao; Liao, Miao; Wang, J. P.; Wong, Waisum
收藏  |  浏览/下载：3/0  |  提交时间：2015/11/10
Dynamic NBTI characteristics of p-MOSFET with N-plasma SiON gate dielectric 其他
2007-01-01
Yan, B.G.; Kang, J.F.; Sa, N.; Liu, X.Y.; Du, G.; Han, R.Q.; Liao, C.C.; Gan, Z.H.; Liao, M.; Wang, J.P.; Wong, W.
收藏  |  浏览/下载：3/0  |  提交时间：2015/11/10
Scalability and reliability characteristics of CVD HfO2 gate dielectrics with HfN electrodes for advanced CMOS applications 期刊论文
journal of the electrochemical society, 2007
Kang, J. F.; Yu, H. Y.; Ren, C.; Sa, N.; Yang, H.; Li, M.F.; Chan, D. S. H.; Liu, X. Y.; Han, R. Q.; Kwong, D.L.
收藏  |  浏览/下载：2/0  |  提交时间：2015/11/13

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