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Characterization of stress induced in SOS and Si/gamma-Al2O3/Si heteroepitaxial thin films by Raman spectroscopy 外文期刊
2005
作者:  Wang, QY;  Wang, J;  Wang, JH;  Liu, ZL;  Lin, LY
收藏  |  浏览/下载:9/0  |  提交时间:2010/11/26
The reactive ion etching of Bi2Ti2O7 thin films on silicon substrates and its image in atomic force microscopy 外文期刊
2002
作者:  Wang, Z;  Sun, DL;  Hu, JF;  Cui, DL;  Xu, XH
收藏  |  浏览/下载:16/0  |  提交时间:2010/11/26


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