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Determinants of Firm Failure: Empirical Evidence from China 其他
2016-01-01
He, Canfei; Yang, Rudai
收藏  |  浏览/下载：5/0  |  提交时间：2017/12/03
Adding the missing time-dependent layout dependency into device-circuit-layout co-optimization-New findings on the layout dependent aging effects 其他
2016-01-01
Ren, Pengpeng; Xu, Xiaoqing; Hao, Peng; Wang, Junyao; Wang, Runsheng; Li, Ming; Wang, Jianping; Bu, Weihai; Wu, Jingang; Wong, Waisum; Yu, Shaofeng; Wu, Hanming; Lee, Shiuh-Wuu; Pan, David Z.; Huang, Ru
收藏  |  浏览/下载：11/0  |  提交时间：2017/12/03
Improvement of DRIE simulation method for process development application 其他
2015-01-01
Du, Hong; Yu, Min; Qi, Lin; Zhu, Zhiyuan; Wang, Hao; Zhang, Haixia; Jin, Yufeng; Shi, Baohua; Zhang, Zhao
收藏  |  浏览/下载：3/0  |  提交时间：2017/12/03
Improvement of DRIE simulation method for process development application 其他
2015-01-01
Du, Hong; Yu, Min; Qi, Lin; Zhu, Zhiyuan; Wang, Hao; Zhang, Haixia; Jin, Yufeng; Shi, Baohua; Zhang, Zhao
收藏  |  浏览/下载：4/0  |  提交时间：2017/12/03
A Unified Approach for Trap-Aware Device/Circuit Co-Design in Nanoscale CMOS Technology 其他
2013-01-01
Wang, Runsheng; Luo, Mulong; Guo, Shaofeng; Huang, Ru; Liu, Changze; Zou, Jibin; Wang, Jianping; Wu, Jingang; Xu, Nuo; Wong, Waisum; Yu, Scott; Wu, Hanming; Lee, Shiuh-Wuu; Wang, Yangyuan
收藏  |  浏览/下载：2/0  |  提交时间：2015/11/13
NOISE  
拓扑绝缘体二维纳米结构与器件 其他
2012-01-01
李辉; 彭海琳; 刘忠范
收藏  |  浏览/下载：5/0  |  提交时间：2015/10/24
Experimental investigation of Quasi-SOI MOSFET for highly scaled devices 其他
2006-01-01
Tian, Yu; Xiao, Han; Huang, Ru; Feng, Chuguang; Chan, Mansun; Zhang, Xing; Wang, Yangyuan
收藏  |  浏览/下载：5/0  |  提交时间：2015/11/13
Photoelectronic studies on an asymmetric step quantum-well middle wavelength infrared detector 其他
2001-01-01
Wu, WG
收藏  |  浏览/下载：3/0  |  提交时间：2015/11/13

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