QQ客服 官方微博 反馈留言

浏览/检索结果: 共5条，第1-5条 帮助 限定条件 内容类型：会议论文     已选(0)清除 条数/页：5101520253035404550556065707580859095100   排序方式：请选择作者升序作者降序题名升序题名降序发表日期升序发表日期降序提交时间升序提交时间降序 Research of Thermoanalysis of Horizontal Casting Machine Supporting Parts Based on Finite Element 会议论文 作者:  Ren, Lina;  Liu, Chun;  Rui, Zhiyuan;  Kou, Mingyan 收藏  |  浏览/下载：14/0  |  提交时间：2019/11/15 horizontal casting machine  supporting parts  finite element  thermal stress   Research of thermoanalysis of horizontal casting machine supporting parts based on finite element 会议论文 Beijing, China, December 20, 2012 - December 21, 2012 作者:  Ren, Li Na;  Liu, Chun;  Rui, Zhi Yuan;  Kou, Ming Yan 收藏  |  浏览/下载：0/0  |  提交时间：2020/11/15 Aluminum castings  Chains  Computer software  Continuous casting  Deformation  Digital storage  Finite element method  Ingots  Product design  Structural optimization  Surface roughness  Thermal stress  Distribution patterns  Finite element software  Horizontal casting  Hot and humid environments  Sequential coupling analysis  Supporting parts  Temperature field simulation  Thermal deformation   Photocurrent derivative spectra of ZnCdSe-ZnSe double multi-quantum wells 会议论文 40th electronic materials conference (emc-40), charlottesville, virginia, jun 24-26, 1998 作者:  Zhang JY;  Jiang DS 收藏  |  浏览/下载：20/0  |  提交时间：2010/11/15 double multi-quantum wells  photocurrent spectra  ZnCdSe-ZnSe  SPECTROSCOPY  PHOTOLUMINESCENCE  HETEROSTRUCTURES  PHOTODETECTORS   Design of prognostic circuit for hot carrier injection failure of integrated circuit (EI收录) 会议论文 QR2MSE 2013 - Proceedings of 2013 International Conference on Quality, Reliability, Risk, Maintenance, and Safety Engineering, Sichuan, China, July 15, 2013 - July 18, 2013 作者:  Wang, Bin[1];  Chen, Yiqiang[2];  En, Yunfei[2];  Huang, Yun[2];  Lu, Yudong[2] 收藏  |  浏览/下载：3/0  |  提交时间：2019/04/15 CMOS integrated circuits  Hot carriers  Maintenance  Safety engineering  Systems engineering   Pre-designed Prognostic cells for host circuits reliability monitoring (EI收录) 会议论文 2011 International Conference on Electric Information and Control Engineering, ICEICE 2011 - Proceedings, Wuhan, China, April 15, 2011 - April 17, 2011 作者:  Lu, Yu-Dong[1];  En, Yun-Fei[1];  Luo, Hong-Wei[1];  Wan, Ming[2] 收藏  |  浏览/下载：2/0  |  提交时间：2019/04/15 Dielectric materials  Failure analysis  Hot carriers  Integrated circuits  Integration  Safety engineering